Inventor

TSUJI TAKAHARU

JP37 patents

⚠️ This page may combine multiple inventors who share the name “TSUJI TAKAHARU”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

TSUJI TAKAHARU

MITSUBISHI ELECTRIC CORP

Semiconductor device with reduced current consumption in standby state

Semiconductor device with reduced current consumption in standby state

Semiconductor device having hierarchical power supply line structure improved in operating speed

Semiconductor memory device that can carry out read disturb testing and burn-in testing reliably

Write system architecture of magnetic memory array divided into a plurality of memory blocks

Signal potential conversion circuit

Multi-bank semiconductor memory device

Semiconductor memory device capable of reducing leakage current flowing into substrate

Semiconductor memory device including disturb refresh test circuit

Method of arranging alignment marks

Semiconductor memory device with simultaneous data line selection and shift redundancy selection

Semiconductor memory device capable of high speed operation and including redundant cells

Control signal generation circuit and semiconductor memory device that can correspond to high speed external clock signal

Internal voltage detecting circuit having superior responsibility

Method of arranging alignment marks

Semiconductor memory device having a column select line transmitting a column select signal

Semiconductor integrated circuit device provided with a logic circuit and a memory circuit and being capable of efficient interface between the same

RENESAS TECH CORP

Nonvolatile semiconductor memory device

Magnetic memory device with reference cell for data reading

Magnetic random access memory device with a reduced number of interconnections for selection of address

Thin film magnetic memory device having dummy cell

Thin-film magnetic memory device suppressing parasitic capacitance applied to data line or the like

Semiconductor integrated circuit device and magnetic memory device capable of maintaining data integrity

Semiconductor device with reduced current consumption in standby state

Semiconductor integrated circuit device and magnetic memory device capable of maintaining data integrity

Semiconductor integrated circuit device with a plurality of memory cells storing data

Tester built-in semiconductor integrated circuit device

Semiconductor memory device capable of testing data line redundancy replacement circuit

Thin film magnetic memory device for selectively supplying a desired data write current to a plurality of memory blocks

Thin film magnetic memory device for selectively supplying a desired data write current to a plurality of memory blocks

Semiconductor memory device capable of testing data line redundancy replacement circuit

MITSUBISHI ELECTRIC ENG

Thin film magnetic memory device provided with a dummy cell for data read reference

Semiconductor integrated circuit device with internal power supply potential generation circuit

TANIZAKI HIROAKI

Semiconductor device

Magnetic memory device

MITISUBISHI DENKI KABUSHIKI KA

Semiconductor memory device allowing high-speed activation of internal circuit

TSUJI TAKAHARU

Semiconductor device