Inventor

NAGAO TOSHISHIGE

JP5 patents

Patents

5 patents

US4730116AMar 8, 1988

Sheet thickness measuring apparatus by optical scanning

MITSUBISHI ELECTRIC CORP9 citations71

US4810894AMar 7, 1989

Method and apparatus for measuring film thickness using a second sheet of known thickness

MITSUBISHI ELECTRIC CORP10 citations70

US4748331AMay 31, 1988

Film thickness measuring device with signal averaging to compensate for roller eccentricity

MITSUBISHI ELECTRIC CORP12 citations70

US4991969AFeb 12, 1991

Method for measuring film thickness

MITSUBISHI ELECTRIC CORP2 citations59

US4924105AMay 8, 1990

Optical measuring device with alternately-activated detection

MITSUBISHI ELECTRIC CORP5 citations59