Inventor
LIN BENJAMIN SZU-MIN
TW49 patents
⚠️ This page may combine multiple inventors who share the name “LIN BENJAMIN SZU-MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
38 patentsUS6010807AJan 4, 2000
Phase-shifting mask for photolithography in semiconductor fabrications
UNITED MICROELECTRONICS CORP52 citations96
US6004702ADec 21, 1999
Phase-shifting mask structure and method of fabricating the same
UNITED MICROELECTRONICS CORP59 citations96
US5989997ANov 23, 1999
Method for forming dual damascene structure
UNITED MICROELECTRONICS CORP67 citations96
US6534412B1Mar 18, 2003
Method for removing native oxide
UNITED MICROELECTRONICS CORP23 citations92
US6100014AAug 8, 2000
Method of forming an opening in a dielectric layer through a photoresist layer with silylated sidewall spacers
UNITED MICROELECTRONICS CORP51 citations92
US6071656AJun 6, 2000
Photolithography technique utilizing alignment marks at scribe line intersections
UNITED MICROELECTRONICS CORP43 citations92
US6042996AMar 28, 2000
Method of fabricating a dual damascene structure
UNITED MICROELECTRONICS CORP46 citations92
US5998260ADec 7, 1999
Method for manufacturing DRAM capacitor
UNITED MICROELECTRONICS CORP29 citations92
US6740473B1May 25, 2004
Method for shrinking critical dimension of semiconductor devices
UNITED MICROELECTRONICS CORP14 citations82
US7018788B2Mar 28, 2006
Phase shifting lithographic process
UNITED MICROELECTRONICS CORP6 citations74
US6844143B2Jan 18, 2005
Sandwich photoresist structure in photolithographic process
UNITED MICROELECTRONICS CORP8 citations74
US6348287B1Feb 19, 2002
Multiphase phase shifting mask
UNITED MICROELECTRONICS CORP7 citations74
US6207328B1Mar 27, 2001
Method of forming a phase shift mask
UNITED MICROELECTRONICS CORP8 citations74
US6124162ASep 26, 2000
Method for manufacturing cylindrical lower electrode of DRAM capacitor
UNITED MICROELECTRONICS CORP12 citations74
US6117757ASep 12, 2000
Method of forming landing pads for bit line and node contact
UNITED MICROELECTRONICS CORP10 citations74
US6071653AJun 6, 2000
Method for fabricating a photomask
UNITED MICROELECTRONICS CORP9 citations74
US6057064AMay 2, 2000
Double-alternating phase-shifting mask
UNITED MICROELECTRONICS CORP15 citations74
US6048650AApr 11, 2000
Half tone phase shift mask comprising second pattern layer on backside of substrate
UNITED MICROELECTRONICS CORP15 citations74
US6022645AFeb 8, 2000
Double-sided photomask
UNITED MICROELECTRONICS CORP15 citations74
US5888865AMar 30, 1999
Method for manufacturing dram capacitor
UNITED MICROELECTRONICS CORP7 citations74
US6277685B1Aug 21, 2001
Method of forming a node contact hole on a semiconductor wafer
UNITED MICROELECTRONICS CORP13 citations73
US6849393B2Feb 1, 2005
Phase shifting lithographic process
UNITED MICROELECTRONICS CORP3 citations63
US6296987B1Oct 2, 2001
Method for forming different patterns using one mask
UNITED MICROELECTRONICS CORP5 citations63
US6296991B1Oct 2, 2001
Bi-focus exposure process
UNITED MICROELECTRONICS CORP6 citations63
US6184090B1Feb 6, 2001
Fabrication method for a vertical MOS transistor
UNITED MICROELECTRONICS CORP5 citations63
US6117599ASep 12, 2000
Alignment and exposure process utilizing split beam for exposure and alignment
UNITED MICROELECTRONICS CORP3 citations63
US6007950ADec 28, 1999
Structure of a phase shifting mask and method of fabricating the same
UNITED MICROELECTRONICS CORP5 citations63
US6004845ADec 21, 1999
Method for fabricating a crown-shaped capacitor
UNITED MICROELECTRONICS CORP4 citations63
US7268070B2Sep 11, 2007
Profile improvement method for patterning
UNITED MICROELECTRONICS CORP2 citations62
US6107132AAug 22, 2000
Method of manufacturing a DRAM capacitor
UNITED MICROELECTRONICS CORP6 citations60
US6511891B2Jan 28, 2003
Method of preventing toppling of lower electrode through flush cleaning
UNITED MICROELECTRONICS CORP2 citations57
US7105255B2Sep 12, 2006
EUV reflection mask and lithographic process using the same
UNITED MICROELECTRONICS CORP0 citations52
US6866967B2Mar 15, 2005
Structure of phase shifting mask
UNITED MICROELECTRONICS CORP0 citations52
US6081318AJun 27, 2000
Installation for fabricating double-sided photomask
UNITED MICROELECTRONICS CORP1 citations52
US6187669B1Feb 13, 2001
Method of forming a node contact of a DRAM's memory cell
UNITED MICROELECTRONICS CORP1 citations51
US7476472B2Jan 13, 2009
Method for designing photomask
UNITED MICROELECTRONICS CORP0 citations47
US6291338B1Sep 18, 2001
Method of fabricating self-aligned polysilicon via plug
UNITED MICROELECTRONICS CORP0 citations42
US7633601B2Dec 15, 2009
Method and related operation system for immersion lithography
UNITED MICROELECTRONICS CORP0 citations34
WINBOND ELECTRONICS CORP
4 patentsUS5854124ADec 29, 1998
Method for opening contacts of different depths in a semiconductor wafer
WINBOND ELECTRONICS CORP7 citations74
US5847818ADec 8, 1998
CD vernier apparatus for SEM CD measurement
WINBOND ELECTRONICS CORP16 citations67
US5904533AMay 18, 1999
Metal salicide-CMP-metal salicide semiconductor process
WINBOND ELECTRONICS CORP4 citations63
US5908314AJun 1, 1999
Two-step metal salicide semiconductor process
WINBOND ELECTRONICS CORP6 citations62