P

Inventor

LIN BENJAMIN SZU-MIN

TW49 patents
⚠️ This page may combine multiple inventors who share the name “LIN BENJAMIN SZU-MIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

38 patents
US6010807AJan 4, 2000

Phase-shifting mask for photolithography in semiconductor fabrications

UNITED MICROELECTRONICS CORP52 citations96
US6004702ADec 21, 1999

Phase-shifting mask structure and method of fabricating the same

UNITED MICROELECTRONICS CORP59 citations96
US5989997ANov 23, 1999

Method for forming dual damascene structure

UNITED MICROELECTRONICS CORP67 citations96
US6534412B1Mar 18, 2003

Method for removing native oxide

UNITED MICROELECTRONICS CORP23 citations92
US6100014AAug 8, 2000

Method of forming an opening in a dielectric layer through a photoresist layer with silylated sidewall spacers

UNITED MICROELECTRONICS CORP51 citations92
US6071656AJun 6, 2000

Photolithography technique utilizing alignment marks at scribe line intersections

UNITED MICROELECTRONICS CORP43 citations92
US6042996AMar 28, 2000

Method of fabricating a dual damascene structure

UNITED MICROELECTRONICS CORP46 citations92
US5998260ADec 7, 1999

Method for manufacturing DRAM capacitor

UNITED MICROELECTRONICS CORP29 citations92
US6740473B1May 25, 2004

Method for shrinking critical dimension of semiconductor devices

UNITED MICROELECTRONICS CORP14 citations82
US7018788B2Mar 28, 2006

Phase shifting lithographic process

UNITED MICROELECTRONICS CORP6 citations74
US6844143B2Jan 18, 2005

Sandwich photoresist structure in photolithographic process

UNITED MICROELECTRONICS CORP8 citations74
US6348287B1Feb 19, 2002

Multiphase phase shifting mask

UNITED MICROELECTRONICS CORP7 citations74
US6207328B1Mar 27, 2001

Method of forming a phase shift mask

UNITED MICROELECTRONICS CORP8 citations74
US6124162ASep 26, 2000

Method for manufacturing cylindrical lower electrode of DRAM capacitor

UNITED MICROELECTRONICS CORP12 citations74
US6117757ASep 12, 2000

Method of forming landing pads for bit line and node contact

UNITED MICROELECTRONICS CORP10 citations74
US6071653AJun 6, 2000

Method for fabricating a photomask

UNITED MICROELECTRONICS CORP9 citations74
US6057064AMay 2, 2000

Double-alternating phase-shifting mask

UNITED MICROELECTRONICS CORP15 citations74
US6048650AApr 11, 2000

Half tone phase shift mask comprising second pattern layer on backside of substrate

UNITED MICROELECTRONICS CORP15 citations74
US6022645AFeb 8, 2000

Double-sided photomask

UNITED MICROELECTRONICS CORP15 citations74
US5888865AMar 30, 1999

Method for manufacturing dram capacitor

UNITED MICROELECTRONICS CORP7 citations74
US6277685B1Aug 21, 2001

Method of forming a node contact hole on a semiconductor wafer

UNITED MICROELECTRONICS CORP13 citations73
US6849393B2Feb 1, 2005

Phase shifting lithographic process

UNITED MICROELECTRONICS CORP3 citations63
US6296987B1Oct 2, 2001

Method for forming different patterns using one mask

UNITED MICROELECTRONICS CORP5 citations63
US6296991B1Oct 2, 2001

Bi-focus exposure process

UNITED MICROELECTRONICS CORP6 citations63
US6184090B1Feb 6, 2001

Fabrication method for a vertical MOS transistor

UNITED MICROELECTRONICS CORP5 citations63
US6117599ASep 12, 2000

Alignment and exposure process utilizing split beam for exposure and alignment

UNITED MICROELECTRONICS CORP3 citations63
US6007950ADec 28, 1999

Structure of a phase shifting mask and method of fabricating the same

UNITED MICROELECTRONICS CORP5 citations63
US6004845ADec 21, 1999

Method for fabricating a crown-shaped capacitor

UNITED MICROELECTRONICS CORP4 citations63
US7268070B2Sep 11, 2007

Profile improvement method for patterning

UNITED MICROELECTRONICS CORP2 citations62
US6107132AAug 22, 2000

Method of manufacturing a DRAM capacitor

UNITED MICROELECTRONICS CORP6 citations60
US6511891B2Jan 28, 2003

Method of preventing toppling of lower electrode through flush cleaning

UNITED MICROELECTRONICS CORP2 citations57
US7105255B2Sep 12, 2006

EUV reflection mask and lithographic process using the same

UNITED MICROELECTRONICS CORP0 citations52
US6866967B2Mar 15, 2005

Structure of phase shifting mask

UNITED MICROELECTRONICS CORP0 citations52
US6081318AJun 27, 2000

Installation for fabricating double-sided photomask

UNITED MICROELECTRONICS CORP1 citations52
US6187669B1Feb 13, 2001

Method of forming a node contact of a DRAM's memory cell

UNITED MICROELECTRONICS CORP1 citations51
US7476472B2Jan 13, 2009

Method for designing photomask

UNITED MICROELECTRONICS CORP0 citations47
US6291338B1Sep 18, 2001

Method of fabricating self-aligned polysilicon via plug

UNITED MICROELECTRONICS CORP0 citations42
US7633601B2Dec 15, 2009

Method and related operation system for immersion lithography

UNITED MICROELECTRONICS CORP0 citations34

WINBOND ELECTRONICS CORP

4 patents

INFINEON TECHNOLOGIES AG

2 patents

UNITED MICROELECTRONICS CROP

1 patent

UNITED MICROELECTRONICS CO

1 patent

(unassigned)

1 patent

UNITED MICROELETRONICS CORP

1 patent

LIU HANG YIP

1 patent