Inventor
CLEMENTI LEE D
US5 patents
⚠️ This page may combine multiple inventors who share the name “CLEMENTI LEE D”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ADE OPTICAL SYST CORP
4 patentsUS6118525ASep 12, 2000
Wafer inspection system for distinguishing pits and particles
ADE OPTICAL SYST CORP122 citations97
US5712701AJan 27, 1998
Surface inspection system and method of inspecting surface of workpiece
ADE OPTICAL SYST CORP164 citations97
US6509965B2Jan 21, 2003
Wafer inspection system for distinguishing pits and particles
ADE OPTICAL SYST CORP38 citations95
US6292259B1Sep 18, 2001
Wafer inspection system for distinguishing pits and particles
ADE OPTICAL SYST CORP78 citations92