Inventor
HSIEH CHEN-HUI
TW17 patents
⚠️ This page may combine multiple inventors who share the name “HSIEH CHEN-HUI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG
14 patentsUS6995601B2Feb 7, 2006
Fuse state detection circuit
TAIWAN SEMICONDUCTOR MFG32 citations92
US7755344B2Jul 13, 2010
Ultra low-voltage sub-bandgap voltage reference generator
TAIWAN SEMICONDUCTOR MFG8 citations83
US7459350B2Dec 2, 2008
Method for fabricating a protection circuit located under fuse window
TAIWAN SEMICONDUCTOR MFG10 citations83
US7484138B2Jan 27, 2009
Method and system for improving reliability of memory device
TAIWAN SEMICONDUCTOR MFG17 citations82
US7499519B1Mar 3, 2009
Bidirectional shift register
TAIWAN SEMICONDUCTOR MFG13 citations81
US7098491B2Aug 29, 2006
Protection circuit located under fuse window
TAIWAN SEMICONDUCTOR MFG10 citations73
US7111193B1Sep 19, 2006
Semiconductor memory having re-configurable fuse set for redundancy repair
TAIWAN SEMICONDUCTOR MFG9 citations70
US7663953B2Feb 16, 2010
Method for high speed sensing for extra low voltage DRAM
TAIWAN SEMICONDUCTOR MFG6 citations62
US7599212B2Oct 6, 2009
Method and apparatus for high-efficiency operation of a dynamic random access memory
TAIWAN SEMICONDUCTOR MFG3 citations62
US7161845B2Jan 9, 2007
Static random access memory device having a memory cell with multiple bit-elements
TAIWAN SEMICONDUCTOR MFG5 citations62
US7808753B2Oct 5, 2010
System and method for monitoring negative bias in integrated circuits
TAIWAN SEMICONDUCTOR MFG2 citations61
US7656726B2Feb 2, 2010
Memory with improved BIST
TAIWAN SEMICONDUCTOR MFG5 citations60
US7663908B2Feb 16, 2010
Method for increasing retention time in DRAM
TAIWAN SEMICONDUCTOR MFG1 citations51
US7212939B2May 1, 2007
Method and system for timing measurement of embedded macro module
TAIWAN SEMICONDUCTOR MFG1 citations50