Inventor
HAMASHIMA MUNEKI
JP42 patents
⚠️ This page may combine multiple inventors who share the name “HAMASHIMA MUNEKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NIKON CORP
18 patentsUS7095022B2Aug 22, 2006
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
NIKON CORP48 citations96
US6479819B1Nov 12, 2002
Object observation apparatus and object observation
NIKON CORP69 citations96
US6365897B1Apr 2, 2002
Electron beam type inspection device and method of making same
NIKON CORP66 citations96
US6184526B1Feb 6, 2001
Apparatus and method for inspecting predetermined region on surface of specimen using electron beam
NIKON CORP120 citations96
US6670602B1Dec 30, 2003
Scanning device and scanning method
NIKON CORP21 citations92
US5479537ADec 26, 1995
Image processing method and apparatus
NIKON CORP48 citations92
US6011262AJan 4, 2000
Object observing apparatus and method for adjusting the same
NIKON CORP27 citations91
US5373567ADec 13, 1994
Method and apparatus for pattern matching
NIKON CORP14 citations74
US9693036B2Jun 27, 2017
Imaging apparatus, image processing device, computer-readable medium having stored thereon an imaging apparatus controlling program, and computer-readable medium having stored thereon an image processing program
NIKON CORP2 citations73
US9706186B2Jul 11, 2017
Imaging apparatus for generating parallax image data
NIKON CORP5 citations69
US10412358B2Sep 10, 2019
Image sensor, image-capturing apparatus and image-capturing system
NIKON CORP0 citations52
US9906770B2Feb 27, 2018
Image sensor, image-capturing apparatus and image capturing system
NIKON CORP0 citations52
US6953944B2Oct 11, 2005
Scanning device and method including electric charge movement
NIKON CORP1 citations52
US10429402B2Oct 1, 2019
Washing/drying apparatus, screening apparatus, washing/drying method, and screening method
NIKON CORP0 citations45
US10027942B2Jul 17, 2018
Imaging processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereon
NIKON CORP0 citations42
US9727985B2Aug 8, 2017
Image processing apparatus, image-capturing apparatus, and storage medium having image processing program stored thereon
NIKON CORP0 citations42
US9414046B2Aug 9, 2016
Image sensor, imaging device and image processing device
NIKON CORP0 citations42
US9706190B2Jul 11, 2017
Image processing apparatus and image processing program
NIKON CORP0 citations40
EBARA CORP
14 patentsUS7109483B2Sep 19, 2006
Method for inspecting substrate, substrate inspecting system and electron beam apparatus
EBARA CORP159 citations99
US6593152B2Jul 15, 2003
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
EBARA CORP109 citations99
US7244932B2Jul 17, 2007
Electron beam apparatus and device fabrication method using the electron beam apparatus
EBARA CORP74 citations98
US7601972B2Oct 13, 2009
Inspection system by charged particle beam and method of manufacturing devices using the system
EBARA CORP49 citations96
US7135676B2Nov 14, 2006
Inspection system by charged particle beam and method of manufacturing devices using the system
EBARA CORP61 citations96
US7297949B2Nov 20, 2007
Inspection system by charged particle beam and method of manufacturing devices using the system
EBARA CORP28 citations93
US7129485B2Oct 31, 2006
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
EBARA CORP30 citations93
US7439502B2Oct 21, 2008
Electron beam apparatus and device production method using the electron beam apparatus
EBARA CORP23 citations92
US7247848B2Jul 24, 2007
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
EBARA CORP28 citations92
US7888642B2Feb 15, 2011
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
EBARA CORP9 citations84
US7205559B2Apr 17, 2007
Electron beam apparatus and device manufacturing method using same
EBARA CORP14 citations84
US7423267B2Sep 9, 2008
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
EBARA CORP8 citations74
US7598471B2Oct 6, 2009
Method of electric discharge machining a cathode for an electron gun
EBARA CORP3 citations63
US7745784B2Jun 29, 2010
Electron beam apparatus and method of manufacturing semiconductor device using the apparatus
EBARA CORP4 citations62
NIPPON KOGAKU KK
7 patentsUSRE41665ESep 14, 2010
Object observation apparatus and object observation
NIPPON KOGAKU KK57 citations97
USRE40221EApr 8, 2008
Object observation apparatus and object observation
NIPPON KOGAKU KK58 citations97
US4744663AMay 17, 1988
Pattern position detection apparatus using laser beam
NIPPON KOGAKU KK58 citations96
US9860516B2Jan 2, 2018
Image processing apparatus, image processing method and recording medium
NIPPON KOGAKU KK10 citations84
US4769551ASep 6, 1988
Pattern detecting apparatus utilizing energy beam
NIPPON KOGAKU KK22 citations76
US9888226B2Feb 6, 2018
Image capturing device and program to control image capturing device
NIPPON KOGAKU KK0 citations42
US9838665B2Dec 5, 2017
Image processing device, imaging device, and image processing program
NIPPON KOGAKU KK0 citations42