Inventor
DOCZY MARK
US43 patents
⚠️ This page may combine multiple inventors who share the name “DOCZY MARK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
INTEL CORP
41 patentsUS7531437B2May 12, 2009
Method of forming metal gate electrodes using sacrificial gate electrode material and sacrificial gate dielectric material
INTEL CORP195 citations99
US6696345B2Feb 24, 2004
Metal-gate electrode for CMOS transistor applications
INTEL CORP164 citations99
US6617209B1Sep 9, 2003
Method for making a semiconductor device having a high-k gate dielectric
INTEL CORP132 citations99
US7361958B2Apr 22, 2008
Nonplanar transistors with metal gate electrodes
INTEL CORP86 citations98
US7326656B2Feb 5, 2008
Method of forming a metal oxide dielectric
INTEL CORP456 citations98
US6890807B2May 10, 2005
Method for making a semiconductor device having a metal gate electrode
INTEL CORP67 citations98
US6858483B2Feb 22, 2005
Integrating n-type and p-type metal gate transistors
INTEL CORP81 citations98
US6620713B2Sep 16, 2003
Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication
INTEL CORP80 citations98
US7316949B2Jan 8, 2008
Integrating n-type and p-type metal gate transistors
INTEL CORP50 citations96
US7030430B2Apr 18, 2006
Transition metal alloys for use as a gate electrode and devices incorporating these alloys
INTEL CORP81 citations96
US6972225B2Dec 6, 2005
integrating n-type and P-type metal gate transistors
INTEL CORP54 citations96
US6953719B2Oct 11, 2005
Integrating n-type and p-type metal gate transistors
INTEL CORP62 citations96
US7528025B2May 5, 2009
Nonplanar transistors with metal gate electrodes
INTEL CORP52 citations95
US7666727B2Feb 23, 2010
Semiconductor device having a laterally modulated gate workfunction and method of fabrication
INTEL CORP39 citations93
US7285829B2Oct 23, 2007
Semiconductor device having a laterally modulated gate workfunction and method of fabrication
INTEL CORP41 citations93
US6998686B2Feb 14, 2006
Metal-gate electrode for CMOS transistor applications
INTEL CORP23 citations93
US6743683B2Jun 1, 2004
Polysilicon opening polish
INTEL CORP31 citations93
US7682891B2Mar 23, 2010
Tunable gate electrode work function material for transistor applications
INTEL CORP19 citations92
US7439113B2Oct 21, 2008
Forming dual metal complementary metal oxide semiconductor integrated circuits
INTEL CORP23 citations92
US6968850B2Nov 29, 2005
In-situ cleaning of light source collector optics
INTEL CORP30 citations92
US6664173B2Dec 16, 2003
Hardmask gate patterning technique for all transistors using spacer gate approach for critical dimension control
INTEL CORP27 citations89
US7936025B2May 3, 2011
Metalgate electrode for PMOS transistor
INTEL CORP13 citations84
US7754552B2Jul 13, 2010
Preventing silicide formation at the gate electrode in a replacement metal gate technology
INTEL CORP8 citations84
US7192856B2Mar 20, 2007
Forming dual metal complementary metal oxide semiconductor integrated circuits
INTEL CORP13 citations84
US7166505B2Jan 23, 2007
Method for making a semiconductor device having a high-k gate dielectric
INTEL CORP11 citations84
US7195021B2Mar 27, 2007
In-situ cleaning of light source collector optics
INTEL CORP5 citations74
US7144816B2Dec 5, 2006
Polysilicon opening polish
INTEL CORP6 citations74
US6809017B2Oct 26, 2004
Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication
INTEL CORP8 citations74
US11462678B2Oct 4, 2022
Perpendicular spin transfer torque memory (pSTTM) devices with enhanced thermal stability and methods to form the same
INTEL CORP2 citations73
US11386951B2Jul 12, 2022
Multi-level magnetic tunnel junction (MTJ) devices including mobile magnetic skyrmions or ferromagnetic domains
INTEL CORP2 citations73
US11227644B2Jan 18, 2022
Self-aligned spin orbit torque (SOT) memory devices and their methods of fabrication
INTEL CORP5 citations73
US7193253B2Mar 20, 2007
Transition metal alloys for use as a gate electrode and devices incorporating these alloys
INTEL CORP9 citations72
US7122870B2Oct 17, 2006
Methods of forming a multilayer stack alloy for work function engineering
INTEL CORP7 citations70
US6849509B2Feb 1, 2005
Methods of forming a multilayer stack alloy for work function engineering
INTEL CORP10 citations70
US8013401B2Sep 6, 2011
Selectively depositing aluminum in a replacement metal gate process
INTEL CORP4 citations63
US7420254B2Sep 2, 2008
Semiconductor device having a metal gate electrode
INTEL CORP4 citations63
US11430943B2Aug 30, 2022
Magnetic tunnel junction (MTJ) devices with a synthetic antiferromagnet (SAF) structure including a magnetic skyrmion
INTEL CORP1 citations62
US11348970B2May 31, 2022
Spin orbit torque (SOT) memory device with self-aligned contacts and their methods of fabrication
INTEL CORP0 citations62
US11257613B2Feb 22, 2022
Spin orbit torque (SOT) memory devices with enhanced tunnel magnetoresistance ratio and their methods of fabrication
INTEL CORP0 citations62
US10964886B2Mar 30, 2021
Spin transfer torque memory devices having heusler magnetic tunnel junctions
INTEL CORP0 citations62
US11437567B2Sep 6, 2022
Perpendicular spin transfer torque magnetic mechanism
INTEL CORP0 citations61