P

Inventor

DOCZY MARK

US43 patents
⚠️ This page may combine multiple inventors who share the name “DOCZY MARK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

INTEL CORP

41 patents
US7531437B2May 12, 2009

Method of forming metal gate electrodes using sacrificial gate electrode material and sacrificial gate dielectric material

INTEL CORP195 citations99
US6696345B2Feb 24, 2004

Metal-gate electrode for CMOS transistor applications

INTEL CORP164 citations99
US6617209B1Sep 9, 2003

Method for making a semiconductor device having a high-k gate dielectric

INTEL CORP132 citations99
US7361958B2Apr 22, 2008

Nonplanar transistors with metal gate electrodes

INTEL CORP86 citations98
US7326656B2Feb 5, 2008

Method of forming a metal oxide dielectric

INTEL CORP456 citations98
US6890807B2May 10, 2005

Method for making a semiconductor device having a metal gate electrode

INTEL CORP67 citations98
US6858483B2Feb 22, 2005

Integrating n-type and p-type metal gate transistors

INTEL CORP81 citations98
US6620713B2Sep 16, 2003

Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication

INTEL CORP80 citations98
US7316949B2Jan 8, 2008

Integrating n-type and p-type metal gate transistors

INTEL CORP50 citations96
US7030430B2Apr 18, 2006

Transition metal alloys for use as a gate electrode and devices incorporating these alloys

INTEL CORP81 citations96
US6972225B2Dec 6, 2005

integrating n-type and P-type metal gate transistors

INTEL CORP54 citations96
US6953719B2Oct 11, 2005

Integrating n-type and p-type metal gate transistors

INTEL CORP62 citations96
US7528025B2May 5, 2009

Nonplanar transistors with metal gate electrodes

INTEL CORP52 citations95
US7666727B2Feb 23, 2010

Semiconductor device having a laterally modulated gate workfunction and method of fabrication

INTEL CORP39 citations93
US7285829B2Oct 23, 2007

Semiconductor device having a laterally modulated gate workfunction and method of fabrication

INTEL CORP41 citations93
US6998686B2Feb 14, 2006

Metal-gate electrode for CMOS transistor applications

INTEL CORP23 citations93
US6743683B2Jun 1, 2004

Polysilicon opening polish

INTEL CORP31 citations93
US7682891B2Mar 23, 2010

Tunable gate electrode work function material for transistor applications

INTEL CORP19 citations92
US7439113B2Oct 21, 2008

Forming dual metal complementary metal oxide semiconductor integrated circuits

INTEL CORP23 citations92
US6968850B2Nov 29, 2005

In-situ cleaning of light source collector optics

INTEL CORP30 citations92
US6664173B2Dec 16, 2003

Hardmask gate patterning technique for all transistors using spacer gate approach for critical dimension control

INTEL CORP27 citations89
US7936025B2May 3, 2011

Metalgate electrode for PMOS transistor

INTEL CORP13 citations84
US7754552B2Jul 13, 2010

Preventing silicide formation at the gate electrode in a replacement metal gate technology

INTEL CORP8 citations84
US7192856B2Mar 20, 2007

Forming dual metal complementary metal oxide semiconductor integrated circuits

INTEL CORP13 citations84
US7166505B2Jan 23, 2007

Method for making a semiconductor device having a high-k gate dielectric

INTEL CORP11 citations84
US7195021B2Mar 27, 2007

In-situ cleaning of light source collector optics

INTEL CORP5 citations74
US7144816B2Dec 5, 2006

Polysilicon opening polish

INTEL CORP6 citations74
US6809017B2Oct 26, 2004

Interfacial layer for gate electrode and high-k dielectric layer and methods of fabrication

INTEL CORP8 citations74
US11462678B2Oct 4, 2022

Perpendicular spin transfer torque memory (pSTTM) devices with enhanced thermal stability and methods to form the same

INTEL CORP2 citations73
US11386951B2Jul 12, 2022

Multi-level magnetic tunnel junction (MTJ) devices including mobile magnetic skyrmions or ferromagnetic domains

INTEL CORP2 citations73
US11227644B2Jan 18, 2022

Self-aligned spin orbit torque (SOT) memory devices and their methods of fabrication

INTEL CORP5 citations73
US7193253B2Mar 20, 2007

Transition metal alloys for use as a gate electrode and devices incorporating these alloys

INTEL CORP9 citations72
US7122870B2Oct 17, 2006

Methods of forming a multilayer stack alloy for work function engineering

INTEL CORP7 citations70
US6849509B2Feb 1, 2005

Methods of forming a multilayer stack alloy for work function engineering

INTEL CORP10 citations70
US8013401B2Sep 6, 2011

Selectively depositing aluminum in a replacement metal gate process

INTEL CORP4 citations63
US7420254B2Sep 2, 2008

Semiconductor device having a metal gate electrode

INTEL CORP4 citations63
US11430943B2Aug 30, 2022

Magnetic tunnel junction (MTJ) devices with a synthetic antiferromagnet (SAF) structure including a magnetic skyrmion

INTEL CORP1 citations62
US11348970B2May 31, 2022

Spin orbit torque (SOT) memory device with self-aligned contacts and their methods of fabrication

INTEL CORP0 citations62
US11257613B2Feb 22, 2022

Spin orbit torque (SOT) memory devices with enhanced tunnel magnetoresistance ratio and their methods of fabrication

INTEL CORP0 citations62
US10964886B2Mar 30, 2021

Spin transfer torque memory devices having heusler magnetic tunnel junctions

INTEL CORP0 citations62
US11437567B2Sep 6, 2022

Perpendicular spin transfer torque magnetic mechanism

INTEL CORP0 citations61

LAVOIE ADRIEN R

1 patent

PLANAR SYSTEMS INC

1 patent