Inventor

BROWN KYLE A

US45 patents

⚠️ This page may combine multiple inventors who share the name “BROWN KYLE A”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BROWN KYLE A

KLA TENCOR TECH CORP

Methods and systems for determining a composition and a thickness of a specimen

Methods and systems for determining a critical dimension and overlay of a specimen

Methods and systems for determining at least four properties of a specimen

Methods and systems for determining a critical dimension and overlay of a specimen

Methods and systems for determining a presence of defects and a thin film characteristic of a specimen

Methods and systems for determining a critical dimension, a presence of defects, and a thin film characteristic of a specimen

Methods and systems for determining a critical dimension an a presence of defects on a specimen

Methods and systems for lithography process control

Methods and systems for determining a property of a specimen prior to, during, or subsequent to an etch process

Methods and systems for determining at least one characteristic of defects on at least two sides of a specimen

Methods and systems for determining a thin film characteristic and an electrical property of a specimen

Methods and systems for determining overlay and flatness of a specimen

Methods and systems for determining a thickness of a structure on a specimen and at least one additional property of the specimen

Methods and systems for determining flatness, a presence of defects, and a thin film characteristic of a specimen

Methods and systems for determining an implant characteristic and a presence of defects on a specimen

Methods and systems for determining a presence of macro defects and overlay of a specimen

Methods and systems for lithography process control

Methods and systems for determining a presence of macro and micro defects on a specimen

Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography

Methods and systems for determining an adhesion characteristic and a thickness of a specimen

Methods and systems for lithography process control

Methods and systems for lithography process control

PROCTER & GAMBLE

Absorbent article package

Absorbent article package

Absorbent article package

Absorbent article package

Absorbent article package

Absorbent article package

Absorbent article package

KLA TENCOR TECHNOLOGIES

Methods and systems for determining a critical dimension and a thin film characteristic of a specimen

Methods and systems for determining a presence of macro defects and overlay of a specimen

Methods and systems for determining a characteristic of a layer formed on a specimen by a deposition process

APPLIED MATERIALS INC

Cavitational polishing pad conditioner

Cavitational polishing pad conditioner

Cavitational polishing pad conditioner

LEVY ADY

Methods and systems for determining a critical dimension and overlay of a specimen

Methods and systems for determining a critical dimension and overlay of a specimen

VERTEX AEROSPACE LLC

Method and apparatus for secure communication and routing

Method and apparatus for secure communication and routing

K L A TENCOR TECHNOLOGIES

Methods and systems for determining a presence of macro and micro defects on a specimen

KLA TENCOR INC

Methods and systems for determining a characteristic of a specimen prior to, during, or subsequent to ion implantation

(unassigned)

Aerosol substrate cleaner

FELDMEIER EQUIPMENT INC

Sanitary clamp with concealed threads

KLA TENCOR CORP

Runout characterization

BROWN KYLE A

Dual agitator mixer with sanitary tank