Inventor
IIO MASASHI
JP30 patents
⚠️ This page may combine multiple inventors who share the name “IIO MASASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
SHINETSU CHEMICAL CO
24 patentsUS10816900B2Oct 27, 2020
Tetracarboxylic acid diester compound, polymer of polyimide precursor and method for producing same, negative photosensitive resin composition, patterning process, and method for forming cured film
SHINETSU CHEMICAL CO3 citations73
US10457779B2Oct 29, 2019
Tetracarboxylic acid diester compound, polyimide precursor polymer and method for producing the same, negative photosensitive resin composition, positive photosensitive resin composition, patterning process, and method for forming cured film
SHINETSU CHEMICAL CO4 citations73
US10216085B2Feb 26, 2019
Tetracarboxylic acid diester compound, polyimide precursor polymer and method for producing the same, negative photosensitive resin composition, patterning process, and method for forming cured film
SHINETSU CHEMICAL CO2 citations73
US9377689B2Jun 28, 2016
Silicone structure-bearing polymer, negative resist composition, photo-curable dry film, patterning process, and electric/electronic part-protecting film
SHINETSU CHEMICAL CO5 citations73
US7985528B2Jul 26, 2011
Positive resist composition and patterning process
SHINETSU CHEMICAL CO3 citations63
US12583973B2Mar 24, 2026
Polyimide-based polymer, positive photosensitive resin composition, negative photosensitive resin composition, patterning method, method for forming cured film, interlayer insulating film, surface protective film, and electronic component
SHINETSU CHEMICAL CO0 citations62
US10919918B2Feb 16, 2021
Tetracarboxylic dianhydride, polyimide resin and method for producing the same, photosensitive resin compositions, patterning process, method for forming cured film, interlayer insulating film, surface protective film, and electronic parts
SHINETSU CHEMICAL CO0 citations62
US12197127B2Jan 14, 2025
Negative photosensitive resin composition, patterning process, method for forming cured film, interlayer insulation film, surface protective film, and electronic component
SHINETSU CHEMICAL CO0 citations52
US12195568B2Jan 14, 2025
Positive photosensitive resin composition, positive photosensitive dry film, method for producing positive photosensitive dry film, patterning process, method for forming cured film, interlayer insulation film, surface protective film, and electronic component
SHINETSU CHEMICAL CO0 citations52
US12085856B2Sep 10, 2024
Positive photosensitive resin composition, positive photosensitive dry film, method for producing positive photosensitive dry film, patterning process, method for forming cured film, interlayer insulation film, surface protective film, and electronic component
SHINETSU CHEMICAL CO0 citations52
US11892773B2Feb 6, 2024
Photosensitive resin composition, patterning process, method for forming cured film, interlayer insulation film, surface protective film, and electronic component
SHINETSU CHEMICAL CO0 citations52
US11150556B2Oct 19, 2021
Polymer of polyimide precursor, positive type photosensitive resin composition, negative type photosensitive resin composition, patterning process, method for forming cured film, interlayer insulating film, surface protective film, and electronic parts
SHINETSU CHEMICAL CO0 citations52
US10203601B2Feb 12, 2019
Tetracarboxylic acid diester compound, polymer of polyimide precursor and method for producing same, negative photosensitive resin composition, patterning process, and method for forming cured film
SHINETSU CHEMICAL CO0 citations52
US9400428B2Jul 26, 2016
Polymer compound, chemically amplified negative resist composition, photo-curable dry film and production method thereof, layered product, patterning process, and substrate
SHINETSU CHEMICAL CO1 citations52
US11768434B2Sep 26, 2023
Polymer having a structure of polyamide, polyamide-imide, or polyimide, photosensitive resin composition, patterning process, photosensitive dry film, and protective film for electric and electronic parts
SHINETSU CHEMICAL CO0 citations51
US10114287B2Oct 30, 2018
Silicone skeleton-containing polymer compound and method for producing same, chemically amplified negative resist composition, photo-curable dry film and method for producing same, patterning process, layered product, and substrate
SHINETSU CHEMICAL CO0 citations42
US9017905B2Apr 28, 2015
Chemically amplified positive resist composition and pattern forming process
SHINETSU CHEMICAL CO0 citations42
US9017928B2Apr 28, 2015
Methods for manufacturing resin structure and micro-structure
SHINETSU CHEMICAL CO0 citations42
US8951717B2Feb 10, 2015
Methods for manufacturing resin structure and micro-structure
SHINETSU CHEMICAL CO0 citations42
US8367310B2Feb 5, 2013
Pattern forming process and resist-modifying composition
SHINETSU CHEMICAL CO0 citations42
US10197914B2Feb 5, 2019
Positive photosensitive resin composition, photo-curable dry film and method for producing the same, patterning process, and laminate
SHINETSU CHEMICAL CO0 citations41
US10087288B2Oct 2, 2018
Silicone skeleton-containing polymer compound, chemically amplified negative resist composition, photo-curable dry film and method for producing same, patterning process, layered product, substrate, and semiconductor apparatus
SHINETSU CHEMICAL CO0 citations41
US9557645B2Jan 31, 2017
Positive photosensitive resin composition, photo-curable dry film and method for producing same, layered product, patterning process, and substrate
SHINETSU CHEMICAL CO0 citations41
US9310681B2Apr 12, 2016
Negative resist composition and patterning process using same
SHINETSU CHEMICAL CO0 citations41
WATANABE TAKERU
3 patentsUS8329384B2Dec 11, 2012
Resist-modifying composition and pattern forming process
WATANABE TAKERU10 citations84
US8658346B2Feb 25, 2014
Pattern forming process, chemically amplified positive resist composition, and resist-modifying composition
WATANABE TAKERU6 citations72
US8426105B2Apr 23, 2013
Resist-modifying composition and pattern forming process
WATANABE TAKERU2 citations62
IBM
2 patentsUS11333975B2May 17, 2022
Polymer, photosensitive resin composition, patterning method, method of forming cured film, interlayer insulating film, surface protective film, and electronic component
IBM0 citations62
US11572442B2Feb 7, 2023
Compound, polyimide resin and method of producing the same, photosensitive resin composition, patterning method and method of forming cured film, interlayer insulating film, surface protective film, and electronic component
IBM0 citations51