Inventor

BLACKWOOD JEFFREY

US23 patents

⚠️ This page may combine multiple inventors who share the name “BLACKWOOD JEFFREY”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BLACKWOOD JEFFREY

FEI CO

Method for preparing samples for imaging

Automated TEM sample preparation

High aspect ratio structure analysis

Bulk deposition for tilted mill protection

Method for preparing samples for imaging

Method for preparing samples for imaging

Method for preparing thin samples for TEM imaging

Automated TEM sample preparation

Automated TEM sample preparation

Fiducial design for tilted or glancing mill operations with a charged particle beam

Method and system for reducing curtaining in charged particle beam sample preparation

Face-on, gas-assisted etching for plan-view lamellae preparation

Method for creating S/TEM sample and sample structure

Fiducial design for tilted or glancing mill operations with a charged particle beam

TEM sample preparation

Face-on, gas-assisted etching for plan-view lamellae preparation

Depositing material into high aspect ratio structures

Method for creating S/TEM sample and sample structure

Multidimensional structural access

TEM sample preparation

LSI LOGIC CORP

Wafer-mounted micro-probing platform

BLACKWOOD JEFFREY

TEM sample preparation

LSI CORP

Whole-wafer photoemission analysis