Inventor
WATANABE SHINJIRO
JP9 patents
⚠️ This page may combine multiple inventors who share the name “WATANABE SHINJIRO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO ELECTRON LTD
8 patentsUS9296010B2Mar 29, 2016
Coating film forming apparatus
TOKYO ELECTRON LTD6 citations68
US7221176B2May 22, 2007
Vacuum prober and vacuum probe method
TOKYO ELECTRON LTD4 citations61
US11340259B2May 24, 2022
Probe card management system and probe card management method
TOKYO ELECTRON LTD1 citations59
US11715657B2Aug 1, 2023
Substrate misalignment detection method, substrate position abnormality determination method, substrate transfer control method, and substrate misalignment detection device
TOKYO ELECTRON LTD0 citations56
US12372573B2Jul 29, 2025
Method for setting up test apparatus and test apparatus
TOKYO ELECTRON LTD0 citations48
US12253559B2Mar 18, 2025
Alignment method and inspection apparatus
TOKYO ELECTRON LTD0 citations48
US11499992B2Nov 15, 2022
Inspection system
TOKYO ELECTRON LTD0 citations48
US7896052B2Mar 1, 2011
Bonding apparatus and bonding method
TOKYO ELECTRON LTD1 citations48