Inventor
JAO JUI-HSIU
TW31 patents
Patents
31 patentsUS11876024B2Jan 16, 2024
Method for operating a benchmark device on a semiconductor wafer with fuse element
NANYA TECHNOLOGY CORP3 citations74
US11521976B1Dec 6, 2022
Semiconductor device with bit line contact and method for fabricating the same
NANYA TECHNOLOGY CORP3 citations71
US11557360B1Jan 17, 2023
Memory test circuit and device wafer
NANYA TECHNOLOGY CORP5 citations68
US12272642B2Apr 8, 2025
Benchmark device on a semiconductor wafer with fuse element
NANYA TECHNOLOGY CORP1 citations64
US11843030B2Dec 12, 2023
Fuse elements and semiconductor devices
NANYA TECHNOLOGY CORP0 citations62
US11747394B1Sep 5, 2023
Probe apparatus with a track
NANYA TECHNOLOGY CORP0 citations62
US11668745B1Jun 6, 2023
Probe apparatus having a track and wafer inspection method using the same
NANYA TECHNOLOGY CORP0 citations62
US11262398B2Mar 1, 2022
Testing fixture and testing assembly
NANYA TECHNOLOGY CORP0 citations62
US11209477B2Dec 28, 2021
Testing fixture and testing assembly
NANYA TECHNOLOGY CORP0 citations62
US10692811B1Jun 23, 2020
Semiconductor structure
NANYA TECHNOLOGY CORP1 citations61
US11699624B2Jul 11, 2023
Semiconductor structure with test structure
NANYA TECHNOLOGY CORP0 citations60
US11456224B2Sep 27, 2022
Semiconductor structure with test structure
NANYA TECHNOLOGY CORP0 citations60
US11417574B2Aug 16, 2022
Semiconductor device with testing structure and method for fabricating the same
NANYA TECHNOLOGY CORP1 citations60
US11143690B2Oct 12, 2021
Testing structure and testing method
NANYA TECHNOLOGY CORP0 citations60
US11024553B2Jun 1, 2021
Semiconductor structure and manufacturing method thereof
NANYA TECHNOLOGY CORP0 citations60
US12002752B2Jun 4, 2024
Method for manufacturing a fuse component
NANYA TECHNOLOGY CORP0 citations58
US11916015B2Feb 27, 2024
Fuse component, semiconductor device, and method for manufacturing a fuse component
NANYA TECHNOLOGY CORP0 citations58
US12396162B2Aug 19, 2025
Semiconductor device with programable feature
NANYA TECHNOLOGY CORP0 citations57
US11521901B2Dec 6, 2022
Method for preparing semiconductor device
NANYA TECHNOLOGY CORP0 citations57
US10985077B2Apr 20, 2021
Semiconductor device and method for preparing the same
NANYA TECHNOLOGY CORP0 citations57
US10720389B2Jul 21, 2020
Anti-fuse structure
NANYA TECHNOLOGY CORP1 citations57
US12181517B2Dec 31, 2024
Method for detecting memory chip
NANYA TECHNOLOGY CORP0 citations56
US11876044B2Jan 16, 2024
Method for activating backup unit through fuse element
NANYA TECHNOLOGY CORP0 citations52
US10877086B2Dec 29, 2020
Holder
NANYA TECHNOLOGY CORP0 citations51
US11237205B2Feb 1, 2022
Test array structure, wafer structure and wafer testing method
NANYA TECHNOLOGY CORP0 citations50
US10825744B2Nov 3, 2020
Semiconductor structure and manufacturing method thereof
NANYA TECHNOLOGY CORP0 citations49
US12308315B2May 20, 2025
Fuse component and semiconductor device
NANYA TECHNOLOGY CORP0 citations48
US12057393B2Aug 6, 2024
Semiconductor device with fuse component
NANYA TECHNOLOGY CORP0 citations48
US10756693B1Aug 25, 2020
Integrated circuit device
NANYA TECHNOLOGY CORP0 citations48
US12538468B2Jan 27, 2026
Method of fabricating semiconductor device with programmble feature
NANYA TECHNOLOGY CORP0 citations47
US10566253B2Feb 18, 2020
Electronic device and electrical testing method thereof
NANYA TECHNOLOGY CORP0 citations36