Inventor
SHERRY JEFFREY C
US19 patents
⚠️ This page may combine multiple inventors who share the name “SHERRY JEFFREY C”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
JOHNSTECH INT CORP
12 patentsUS7737708B2Jun 15, 2010
Contact for use in testing integrated circuits
JOHNSTECH INT CORP21 citations92
US9606143B1Mar 28, 2017
Electrically conductive pins for load boards lacking Kelvin capability for microcircuit testing
JOHNSTECH INT CORP12 citations83
US8354854B2Jan 15, 2013
Microcircuit testing interface having kelvin and signal contacts within a single slot
JOHNSTECH INT CORP8 citations83
US9678106B2Jun 13, 2017
Electrically conductive pins for microcircuit tester
JOHNSTECH INT CORP2 citations72
US10247755B2Apr 2, 2019
Electrically conductive kelvin contacts for microcircuit tester
JOHNSTECH INT CORP5 citations71
US10761112B1Sep 1, 2020
Self flattening test socket with anti-bowing and elastomer retention
JOHNSTECH INT CORP3 citations63
US10073117B2Sep 11, 2018
Resilient interposer with electrically conductive slide-by pins as part of a microcircuit tester
JOHNSTECH INT CORP1 citations62
US9297832B2Mar 29, 2016
Electrically conductive pins for microcircuit tester
JOHNSTECH INT CORP1 citations62
US11709183B2Jul 25, 2023
Self flattening test socket with anti-bowing and elastomer retention
JOHNSTECH INT CORP0 citations52
US10302675B2May 28, 2019
Electrically conductive pins microcircuit tester
JOHNSTECH INT CORP0 citations51
US9329204B2May 3, 2016
Electrically conductive Kelvin contacts for microcircuit tester
JOHNSTECH INT CORP0 citations50
US10877090B2Dec 29, 2020
Electrically conductive pins for microcircuit tester
JOHNSTECH INT CORP0 citations40
NELSON JOHN E
3 patentsUS8536889B2Sep 17, 2013
Electrically conductive pins for microcircuit tester
NELSON JOHN E47 citations96
US9007082B2Apr 14, 2015
Electrically conductive pins for microcircuit tester
NELSON JOHN E19 citations82
US8937484B2Jan 20, 2015
Microcircuit tester with slideable electrically conductive pins
NELSON JOHN E3 citations61
ERDMAN JOEL N
2 patentsSHERRY JEFFREY C
2 patentsUS8102184B2Jan 24, 2012
Test contact system for testing integrated circuits with packages having an array of signal and power contacts
SHERRY JEFFREY C19 citations89
US8912811B2Dec 16, 2014
Test contact system for testing integrated circuits with packages having an array of signal and power contacts
SHERRY JEFFREY C5 citations69