Inventor

BIZEN DAISUKE

JP20 patents

⚠️ This page may combine multiple inventors who share the name “BIZEN DAISUKE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

BIZEN DAISUKE

HITACHI HIGH TECH CORP

Scanning electron microscope and sample observation method using scanning electron microscope

Charged particle beam device and measuring method using the same

Pattern critical dimension measurement equipment and method for measuring pattern critical dimension

Charged particle beam apparatus

Pattern cross-sectional shape estimation system and program

Charged particle beam apparatus and control method

Charged particle beam device and sample observation method

Charged particle beam device

Scanning electron microscope and calculation method for three-dimensional structure depth

Charged particle beam apparatus and method for calculating roughness index

Charged particle beam device

Charged-particle beam apparatus

Inspection method

Charged particle beam system and method for determining observation conditions in charged particle beam device

Charged particle beam apparatus

Scanning electron microscope and method for controlling same

HITACHI LTD

Charged particle beam device, simulation method, and simulation device

Scanning microscope with controlled variable measurement parameters

Electron beam device

Scanning electron microscope and electron trajectory adjustment method therefor