Inventor

FROSIEN JUERGEN

DE74 patents

⚠️ This page may combine multiple inventors who share the name “FROSIEN JUERGEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

FROSIEN JUERGEN

INTEGRATED CIRCUIT TESTING

Twin beam charged particle column and method of operating thereof

Objective lens for focusing charged particles in an electron microscope

Charged particle beam device for high spatial resolution and multiple perspective imaging

Multi-axis compound lens, beam system making use of the compound lens, and method using the compound lens

Method of operating an electron beam measuring device

High current density particle beam system

Arrangement and method for compensating emitter tip vibrations

Charged particle beam energy width reduction system for charged particle beam system

Aberration correction device and method for operating same

Analyzing system and charged particle beam device

Focusing lens and charged particle beam device for titled landing angle operation

Charged particle beam emitting device and method for operating a charged particle beam emitting device

Imaging system with multi source array

Beam optical component for charged particle beams

Corpuscular beam device

Dual mode gas field ion source

Arrangement and method for compensating emitter tip vibrations

Energy filter for cold field emission electron beam apparatus

Ultra high precision measurement tool with control loop

Device and method for selecting an emission area of an emission pattern

Method and apparatus for in-situ sample preparation

Double stage charged particle beam energy width reduction system for charged particle beam system

High current density particle beam system

Gas field ION source for multiple applications

SIEMENS AG

Particle beam measuring method for non-contact testing of interconnect networks

Detector objective for particle beam apparatus

Spectrometer objective for particle beam measuring instruments

Electrostatic-magnetic lens for particle beam apparatus

Scanning particle microscope

Electron-optical system with variable-shaped beam for generating and measuring microstructures

Scanning particle microscope with diminished boersch effect

Spectrometer objective for electron beam mensuration techniques

Arrangement for testing micro interconnections and a method for operating the same

Apparatus and method for measuring lengths in a scanning particle microscope

High current electron source

ADVANTEST CORP

Electron beam lens

Objective lens

Gun lens for generating a particle beam

Particle beam apparatus

Dynamically compensated objective lens-detection device and method

Corpuscular beam device

ACT ADVANCED CIRCUIT TESTING

Electrostatic-magnetic lens arrangement

Detector objective lens

Method and apparatus for processing a specimen

Optical unit

Apparatus for generating an electron beam

ALMOGY GILAD

Multi-beam scanning electron beam device and methods of using the same

EBETECH ELECTRON BEAM TECHNOLO

Method and apparatus for testing the function of microstructure elements

JEOL LTD

Electron beam column for writing shaped electron beams

APPLIED MATERIALS ISRAEL LTD

Method and system for discharging a sample