Inventor
LAUBER JAN
US12 patents
⚠️ This page may combine multiple inventors who share the name “LAUBER JAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
KLA TENCOR CORP
6 patentsUS11244442B2Feb 8, 2022
Method and system for correlating optical images with scanning electron microscopy images
KLA TENCOR CORP3 citations72
US10483081B2Nov 19, 2019
Self directed metrology and pattern classification
KLA TENCOR CORP4 citations72
US10410338B2Sep 10, 2019
Method and system for correlating optical images with scanning electron microscopy images
KLA TENCOR CORP2 citations72
US10997710B2May 4, 2021
Adaptive care areas for die-die inspection
KLA TENCOR CORP1 citations61
US10854486B2Dec 1, 2020
System and method for characterization of buried defects
KLA TENCOR CORP1 citations61
US10522376B2Dec 31, 2019
Multi-step image alignment method for large offset die-die inspection
KLA TENCOR CORP1 citations61
KLA CORP
3 patentsUS12444174B2Oct 14, 2025
Rare event training data sets for robust training of semiconductor yield related components
KLA CORP0 citations61
US12100132B2Sep 24, 2024
Laser anneal pattern suppression
KLA CORP0 citations50
US11774371B2Oct 3, 2023
Defect size measurement using deep learning methods
KLA CORP0 citations50