P

Inventor

OHYAMA TSUYOSHI

JP53 patents
⚠️ This page may combine multiple inventors who share the name “OHYAMA TSUYOSHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

CKD CORP

22 patents
US11452250B2Sep 20, 2022

Substrate inspection device that inspects application quality of adhesive

CKD CORP2 citations71
US11039561B2Jun 15, 2021

Component mounting system and adhesive inspection device

CKD CORP2 citations71
US10926907B2Feb 23, 2021

PTP packaging machine

CKD CORP6 citations71
US11927435B2Mar 12, 2024

Three-dimensional measurement device and three-dimensional measurement method

CKD CORP1 citations61
US11214396B2Jan 4, 2022

Inspection device, PTP packaging machine and PTP sheet manufacturing method

CKD CORP0 citations61
US10589914B2Mar 17, 2020

Blister sheet and blister packaging machine

CKD CORP1 citations61
US9511455B2Dec 6, 2016

Substrate inspection device and component mounting device

CKD CORP2 citations61
US10508903B2Dec 17, 2019

Three-dimensional measurement device

CKD CORP1 citations60
US12446162B2Oct 14, 2025

Screen mask inspection device, solder printing inspection device, and method for inspecting screen mask

CKD CORP0 citations58
US11414231B2Aug 16, 2022

Inspection device and PTP packaging machine

CKD CORP0 citations51
US11338950B2May 24, 2022

Inspection device, PTP packaging machine and PTP sheet manufacturing method

CKD CORP0 citations51
US12432895B2Sep 30, 2025

Solder printing inspection device

CKD CORP0 citations50
US11184984B2Nov 23, 2021

Solder printing inspection device, solder printing inspection method and method of manufacturing substrate

CKD CORP0 citations50
US10914574B2Feb 9, 2021

Three-dimensional measurement device

CKD CORP0 citations50
US12291368B2May 6, 2025

Inspection device, packaging sheet manufacturing device, and packaging sheet manufacturing method

CKD CORP0 citations48
US11933742B2Mar 19, 2024

Inspection device, packaging machine, and package inspection method

CKD CORP0 citations48
US11930600B2Mar 12, 2024

Three-dimensional measurement apparatus and three-dimensional measurement method

CKD CORP0 citations47
US12315133B2May 27, 2025

Substrate foreign matter inspection device and substrate foreign matter inspection method

CKD CORP0 citations45
US10563977B2Feb 18, 2020

Three-dimensional measuring device

CKD CORP0 citations40
US10514253B2Dec 24, 2019

Three-dimensional measurement apparatus

CKD CORP0 citations40
US10356298B2Jul 16, 2019

Board inspection apparatus

CKD CORP0 citations40
US10295479B2May 21, 2019

Board inspection apparatus

CKD CORP0 citations40

SAMSUNG ELECTRONICS CO LTD

9 patents

OHYAMA TSUYOSHI

7 patents

SONY CORP

3 patents

JAPAN DISPLAY INC

3 patents

JAPAN DISPLAY WEST INC

3 patents

TOSHIBA KK

1 patent

MAMIYA TAKAHIRO

1 patent

TAKAMA DAISUKE

1 patent

Showing the top 50 of 53 patents by PatentIndex Score.