P

Inventor

KWON HYUNG-SHIN

KR17 patents
⚠️ This page may combine multiple inventors who share the name “KWON HYUNG-SHIN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

SAMSUNG ELECTRONICS CO LTD

14 patents
US6806180B2Oct 19, 2004

Unitary interconnection structures integral with a dielectric layer

SAMSUNG ELECTRONICS CO LTD52 citations96
US7312144B2Dec 25, 2007

Unitary interconnection structures integral with a dielectric layer and fabrication methods thereof

SAMSUNG ELECTRONICS CO LTD24 citations92
US6551887B2Apr 22, 2003

Method of forming a spacer

SAMSUNG ELECTRONICS CO LTD31 citations91
US6767814B2Jul 27, 2004

Semiconductor device having silicide thin film and method of forming the same

SAMSUNG ELECTRONICS CO LTD14 citations82
US7696048B2Apr 13, 2010

Method of improving gate resistance in a memory array

SAMSUNG ELECTRONICS CO LTD8 citations80
US7172944B2Feb 6, 2007

Method of fabricating a semiconductor device having an elevated source/drain

SAMSUNG ELECTRONICS CO LTD6 citations73
US7151031B2Dec 19, 2006

Methods of fabricating semiconductor devices having gate insulating layers with differing thicknesses

SAMSUNG ELECTRONICS CO LTD7 citations73
US7002223B2Feb 21, 2006

Semiconductor device having elevated source/drain

SAMSUNG ELECTRONICS CO LTD9 citations73
US7348231B2Mar 25, 2008

Methods of fabricating semiconductor devices having insulating layers with differing compressive stresses

SAMSUNG ELECTRONICS CO LTD3 citations62
US6635539B2Oct 21, 2003

Method for fabricating a MOS transistor using a self-aligned silicide technique

SAMSUNG ELECTRONICS CO LTD5 citations62
US7385260B2Jun 10, 2008

Semiconductor device having silicide thin film and method of forming the same

SAMSUNG ELECTRONICS CO LTD4 citations60
US6815275B2Nov 9, 2004

Methods for fabricating metal silicide structures using an etch stopping capping layer

SAMSUNG ELECTRONICS CO LTD3 citations56
US10431320B2Oct 1, 2019

Semiconductor memory device, method of testing the same and method of operating the same

SAMSUNG ELECTRONICS CO LTD0 citations50
US9053963B2Jun 9, 2015

Multiple well bias memory

SAMSUNG ELECTRONICS CO LTD1 citations50

KWON HYUNG-SHIN

2 patents

LIM JONG HYOUNG

1 patent