Inventor
TIEMEIJER LUKAS FREDERIK
NL17 patents
⚠️ This page may combine multiple inventors who share the name “TIEMEIJER LUKAS FREDERIK”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
NXP BV
8 patentsUS7671714B2Mar 2, 2010
Planar inductive component and a planar transformer
NXP BV31 citations91
US7928517B2Apr 19, 2011
High frequency transistor layout for low source drain capacitance
NXP BV8 citations83
US9342710B2May 17, 2016
Electronic tamper detection
NXP BV3 citations72
US9159484B2Oct 13, 2015
Integrated circuit based transformer
NXP BV3 citations61
US12003010B2Jun 4, 2024
Planar balun with non-uniform microstrip line width to improve S-parameter alignment
NXP BV0 citations52
US12211840B2Jan 28, 2025
Metal oxide semiconductor device
NXP BV0 citations47
US11742130B2Aug 29, 2023
High current integrated circuit-based transformer
NXP BV0 citations43
US10381447B2Aug 13, 2019
Field effect transistor and method of making
NXP BV0 citations33
TIEMEIJER LUKAS FREDERIK
4 patentsUS8421577B2Apr 16, 2013
Planar inductive unit and an electronic device comprising a planar inductive unit
TIEMEIJER LUKAS FREDERIK3 citations60
US8217747B2Jul 10, 2012
Planar inductor
TIEMEIJER LUKAS FREDERIK4 citations60
US8629495B2Jan 14, 2014
High frequency field-effect transistor
TIEMEIJER LUKAS FREDERIK0 citations39
US8981433B2Mar 17, 2015
Compensation network for RF transistor
TIEMEIJER LUKAS FREDERIK0 citations32
KONINKL PHILIPS ELECTRONICS NV
2 patentsUS7071707B2Jul 4, 2006
Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer
KONINKL PHILIPS ELECTRONICS NV5 citations61
US7026829B2Apr 11, 2006
Method for calibrating and de-embedding, set of devices for de-embedding and vector network analyzer
KONINKL PHILIPS ELECTRONICS NV4 citations61