Inventor
NORMAN VERNON R
US25 patents
Patents
25 patentsUS7295604B2Nov 13, 2007
Method for determining jitter of a signal in a serial link and high speed serial link
IBM36 citations92
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Receiver for clock and data recovery and method for calibrating sampling phases in a receiver for clock and data recovery
IBM50 citations92
US7418069B2Aug 26, 2008
Clock data recovering system with external early/late input
IBM23 citations91
US7315594B2Jan 1, 2008
Clock data recovering system with external early/late input
IBM26 citations91
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Frame stripping protocol for early token release in a ring communication network
IBM29 citations91
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Fast data synchronizer
IBM38 citations90
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Token ring speed detector
IBM25 citations89
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Multiple group address recognition
IBM26 citations86
US7042277B2May 9, 2006
Circuit and method for reducing jitter in a PLL of high speed serial links
IBM13 citations84
US7570071B2Aug 4, 2009
Impedance calibration for source series terminated serial link transmitter
IBM8 citations83
US7368902B2May 6, 2008
Impedance calibration for source series terminated serial link transmitter
IBM12 citations83
US7809054B2Oct 5, 2010
One-sample-per-bit decision feedback equalizer (DFE) clock and data recovery
IBM14 citations81
US6977558B2Dec 20, 2005
Self-adaptive voltage regulator for a phase-locked loop
IBM10 citations73
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Multi-frame stripping protocol for token ring networks
IBM12 citations72
US7512177B2Mar 31, 2009
Method and apparatus for generating random jitter
IBM4 citations63
US7349498B2Mar 25, 2008
Method and system for data and edge detection with correlation tables
IBM3 citations63
US7317777B2Jan 8, 2008
Digital adaptive control loop for data deserialization
IBM4 citations63
US7539473B2May 26, 2009
Overshoot reduction in VCO calibration for serial link phase lock loop (PLL)
IBM2 citations62
US7698802B2Apr 20, 2010
Method for manufacturing a calibration device
IBM4 citations61
US7279950B2Oct 9, 2007
Method and system for high frequency clock signal gating
IBM3 citations58
US7661052B2Feb 9, 2010
Using statistical signatures for testing high-speed circuits
IBM1 citations52
US7340660B2Mar 4, 2008
Method and system for using statistical signatures for testing high-speed circuits
IBM0 citations52
US7085970B2Aug 1, 2006
Fast detection of incorrect sampling in an oversampling clock and data recovery system
IBM1 citations47
US7089132B2Aug 8, 2006
Method and system for providing quality control on wafers running on a manufacturing line
IBM0 citations41
US7477713B2Jan 13, 2009
method for providing automatic adaptation to frequency offsets in high speed serial links
IBM0 citations39