Inventor
OHLHOFF CARSTEN
DE17 patents
Patents
17 patentsUS7231562B2Jun 12, 2007
Memory module, test system and method for testing one or a plurality of memory modules
INFINEON TECHNOLOGIES AG158 citations98
US6756787B2Jun 29, 2004
Integrated circuit having a current measuring unit
INFINEON TECHNOLOGIES AG21 citations92
US6671221B2Dec 30, 2003
Semiconductor chip with trimmable oscillator
INFINEON TECHNOLOGIES AG19 citations92
US7137049B2Nov 14, 2006
Method and apparatus for masking known fails during memory tests readouts
INFINEON TECHNOLOGIES AG11 citations84
US6504394B2Jan 7, 2003
Configuration for trimming reference voltages in semiconductor chips, in particular semiconductor memories
INFINEON TECHNOLOGIES AG18 citations83
US6661718B2Dec 9, 2003
Testing device for testing a memory
INFINEON TECHNOLOGIES AG12 citations74
US7120841B2Oct 10, 2006
Data generator for generating test data for word-oriented semiconductor memories
INFINEON TECHNOLOGIES AG8 citations73
US7107501B2Sep 12, 2006
Test device, test system and method for testing a memory circuit
INFINEON TECHNOLOGIES AG9 citations73
US6891431B2May 10, 2005
Integrated semiconductor circuit configuration
INFINEON TECHNOLOGIES AG8 citations73
US6657452B2Dec 2, 2003
Configuration for measurement of internal voltages of an integrated semiconductor apparatus
INFINEON TECHNOLOGIES AG11 citations73
US6670665B2Dec 30, 2003
Memory module with improved electrical properties
INFINEON TECHNOLOGIES AG5 citations63
US7490274B2Feb 10, 2009
Method and apparatus for masking known fails during memory tests readouts
INFINEON TECHNOLOGIES AG5 citations62
US7197678B2Mar 27, 2007
Test circuit and method for testing an integrated memory circuit
INFINEON TECHNOLOGIES AG6 citations62
US7092303B2Aug 15, 2006
Dynamic memory and method for testing a dynamic memory
INFINEON TECHNOLOGIES AG2 citations62
US6639856B2Oct 28, 2003
Memory chip having a test mode and method for checking memory cells of a repaired memory chip
INFINEON TECHNOLOGIES AG2 citations62
US6549028B1Apr 15, 2003
Configuration and process for testing a multiplicity of semiconductor chips on a wafer plane
INFINEON TECHNOLOGIES AG6 citations62
US7574643B2Aug 11, 2009
Test apparatus and method for testing a circuit unit
INFINEON TECHNOLOGIES AG0 citations43