Inventor
PHANEUF MICHAEL WILLIAM
CA17 patents
⚠️ This page may combine multiple inventors who share the name “PHANEUF MICHAEL WILLIAM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
FIBICS INCORPORATED
10 patentsUS9812290B2Nov 7, 2017
Microscopy imaging method and system
FIBICS INCORPORATED10 citations91
US11462383B2Oct 4, 2022
Method and system for iteratively cross-sectioning a sample to correlatively targeted sites
FIBICS INCORPORATED3 citations83
US10886100B2Jan 5, 2021
Method and system for cross-sectioning a sample with a preset thickness or to a target site
FIBICS INCORPORATED7 citations83
US10586680B2Mar 10, 2020
Microscopy imaging method and system
FIBICS INCORPORATED5 citations83
US11923168B2Mar 5, 2024
Microscopy imaging method for 3D tomography with predictive drift tracking for multiple charged particle beams
FIBICS INCORPORATED1 citations72
US12255044B2Mar 18, 2025
Fiducial guided cross-sectioning and lamella preparation with tomographic data collection
FIBICS INCORPORATED0 citations61
US12007344B2Jun 11, 2024
Method for cross-section sample preparation
FIBICS INCORPORATED0 citations61
USRE50001EJun 4, 2024
Method and system for cross-sectioning a sample with a preset thickness or to a target site
FIBICS INCORPORATED0 citations61
US11726050B2Aug 15, 2023
Method for cross-section sample preparation
FIBICS INCORPORATED0 citations61
US11366074B2Jun 21, 2022
Method for cross-section sample preparation
FIBICS INCORPORATED0 citations61
PHANEUF MICHAEL WILLIAM
3 patentsUS8552406B2Oct 8, 2013
Apparatus and method for surface modification using charged particle beams
PHANEUF MICHAEL WILLIAM52 citations95
US9633819B2Apr 25, 2017
Microscopy imaging method and system
PHANEUF MICHAEL WILLIAM21 citations92
US8466415B2Jun 18, 2013
Methods for performing circuit edit operations with low landing energy electron beams
PHANEUF MICHAEL WILLIAM5 citations82