Inventor
FELDMAN HAIM
IL47 patents
⚠️ This page may combine multiple inventors who share the name “FELDMAN HAIM”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
APPLIED MATERIALS ISRAEL LTD
31 patentsUS7331033B2Feb 12, 2008
Simulation of aerial images
APPLIED MATERIALS ISRAEL LTD14 citations92
US7684048B2Mar 23, 2010
Scanning microscopy
APPLIED MATERIALS ISRAEL LTD12 citations84
US7030978B2Apr 18, 2006
System and method for inspection of a substrate that has a refractive index
APPLIED MATERIALS ISRAEL LTD17 citations84
US10386311B1Aug 20, 2019
System and method for defect detection using multi-spot scanning
APPLIED MATERIALS ISRAEL LTD10 citations83
US9810643B1Nov 7, 2017
System and method for defect detection using multi-spot scanning
APPLIED MATERIALS ISRAEL LTD8 citations83
US9535014B1Jan 3, 2017
Systems and methods for inspecting an object
APPLIED MATERIALS ISRAEL LTD8 citations82
US7187439B2Mar 6, 2007
High throughput inspection system and method for generating transmitted and/or reflected images
APPLIED MATERIALS ISRAEL LTD11 citations81
US6937343B2Aug 30, 2005
Laser scanner with amplitude and phase detection
APPLIED MATERIALS ISRAEL LTD6 citations74
US10481101B2Nov 19, 2019
Asymmetrical magnification inspection system and illumination module
APPLIED MATERIALS ISRAEL LTD2 citations72
US6943898B2Sep 13, 2005
Apparatus and method for dual spot inspection of repetitive patterns
APPLIED MATERIALS ISRAEL LTD10 citations72
US6930770B2Aug 16, 2005
High throughput inspection system and method for generating transmitted and/or reflected images
APPLIED MATERIALS ISRAEL LTD9 citations71
US7924419B2Apr 12, 2011
Illumination system for optical inspection
APPLIED MATERIALS ISRAEL LTD3 citations63
US7634754B2Dec 15, 2009
Simulation of aerial images
APPLIED MATERIALS ISRAEL LTD1 citations63
US7620932B2Nov 17, 2009
Simulation of aerial images
APPLIED MATERIALS ISRAEL LTD2 citations63
US7379161B2May 27, 2008
Printer and a method for recording a multi-level image
APPLIED MATERIALS ISRAEL LTD2 citations63
US7342218B2Mar 11, 2008
Methods and systems for optical inspection of surfaces based on laser screening
APPLIED MATERIALS ISRAEL LTD2 citations63
US11385188B1Jul 12, 2022
System and method for defect detection using multi-spot scanning
APPLIED MATERIALS ISRAEL LTD0 citations61
US7973919B2Jul 5, 2011
High resolution wafer inspection system
APPLIED MATERIALS ISRAEL LTD3 citations61
US12566143B2Mar 3, 2026
Optical inspection systems with pulsed light sources and pulse multiplexing
APPLIED MATERIALS ISRAEL LTD0 citations60
US8659754B2Feb 25, 2014
Inspection system and method for fast changes of focus
APPLIED MATERIALS ISRAEL LTD2 citations59
US12436401B2Oct 7, 2025
Polarization optical system
APPLIED MATERIALS ISRAEL LTD0 citations52
US7286239B2Oct 23, 2007
Laser scanner with amplitude and phase detection
APPLIED MATERIALS ISRAEL LTD0 citations52
US7714999B2May 11, 2010
High resolution wafer inspection system
APPLIED MATERIALS ISRAEL LTD0 citations51
US11270432B1Mar 8, 2022
Inspection of a three dimensional structure of a sample using a phase shift mask
APPLIED MATERIALS ISRAEL LTD0 citations50
US10060736B1Aug 28, 2018
Near-field sensor height control
APPLIED MATERIALS ISRAEL LTD0 citations50
US9835563B2Dec 5, 2017
Evaluation system and a method for evaluating a substrate
APPLIED MATERIALS ISRAEL LTD0 citations49
US7518718B2Apr 14, 2009
High throughput inspection system and a method for generating transmitted and/or reflected images
APPLIED MATERIALS ISRAEL LTD0 citations49
US11815470B2Nov 14, 2023
Multi-perspective wafer analysis
APPLIED MATERIALS ISRAEL LTD0 citations47
US10902582B2Jan 26, 2021
Computerized system and method for obtaining information about a region of an object
APPLIED MATERIALS ISRAEL LTD0 citations47
US9395266B2Jul 19, 2016
On-tool wavefront aberrations measurement system and method
APPLIED MATERIALS ISRAEL LTD0 citations45
US7576348B2Aug 18, 2009
One-dimensional phase contrast microscopy with a traveling lens generated by a step function change
APPLIED MATERIALS ISRAEL LTD0 citations34
APPLIED MATERIALS INC
9 patentsUS6124924ASep 26, 2000
Focus error correction method and apparatus
APPLIED MATERIALS INC73 citations94
US7630069B2Dec 8, 2009
Illumination system for optical inspection
APPLIED MATERIALS INC27 citations92
US6809808B2Oct 26, 2004
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC23 citations92
US7002695B2Feb 21, 2006
Dual-spot phase-sensitive detection
APPLIED MATERIALS INC10 citations74
US7053395B2May 30, 2006
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC10 citations73
US6853475B2Feb 8, 2005
Wafer defect detection system with traveling lens multi-beam scanner
APPLIED MATERIALS INC11 citations73
US6794625B2Sep 21, 2004
Dynamic automatic focusing method and apparatus using interference patterns
APPLIED MATERIALS INC4 citations63
US6671098B2Dec 30, 2003
Scanning angle expander and a method for expanding a scanning beam angle
APPLIED MATERIALS INC3 citations63
US6750436B2Jun 15, 2004
Focus error detection apparatus and method having dual focus error detection path
APPLIED MATERIALS INC4 citations62