Inventor
WU AIPING
US22 patents
⚠️ This page may combine multiple inventors who share the name “WU AIPING”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
AIR PROD & CHEM
9 patentsUS8361237B2Jan 29, 2013
Wet clean compositions for CoWP and porous dielectrics
AIR PROD & CHEM19 citations88
US7879782B2Feb 1, 2011
Aqueous cleaning composition and method for using same
AIR PROD & CHEM8 citations82
US7879783B2Feb 1, 2011
Cleaning composition for semiconductor substrates
AIR PROD & CHEM6 citations73
US7534753B2May 19, 2009
pH buffered aqueous cleaning composition and method for removing photoresist residue
AIR PROD & CHEM7 citations72
US9201308B2Dec 1, 2015
Water-rich stripping and cleaning formulation and method for using same
AIR PROD & CHEM3 citations61
US7888302B2Feb 15, 2011
Aqueous based residue removers comprising fluoride
AIR PROD & CHEM6 citations61
US9536730B2Jan 3, 2017
Cleaning formulations
AIR PROD & CHEM0 citations51
US7682458B2Mar 23, 2010
Aqueous based residue removers comprising fluoride
AIR PROD & CHEM0 citations50
US10073351B2Sep 11, 2018
Semi-aqueous photoresist or semiconductor manufacturing residue stripping and cleaning composition with improved silicon passivation
AIR PROD & CHEM1 citations49
VERSUM MAT US LLC
7 patentsUS12110435B2Oct 8, 2024
Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device
VERSUM MAT US LLC3 citations72
US12298669B2May 13, 2025
Composition comprising three alkanolamines and a hydroxylamine for removing etch residues
VERSUM MAT US LLC0 citations62
US11091727B2Aug 17, 2021
Post etch residue cleaning compositions and methods of using the same
VERSUM MAT US LLC0 citations61
US12281251B2Apr 22, 2025
Etching composition and method for selectively removing silicon nitride during manufacture of a semiconductor device
VERSUM MAT US LLC0 citations60
US12325844B2Jun 10, 2025
Photoresist remover
VERSUM MAT US LLC0 citations59
US10400167B2Sep 3, 2019
Etching compositions and methods for using same
VERSUM MAT US LLC1 citations59
US12518966B2Jan 6, 2026
Selective plasma enhanced atomic layer deposition
VERSUM MAT US LLC0 citations45
WU AIPING
3 patentsUS8772214B2Jul 8, 2014
Aqueous cleaning composition for removing residues and method using same
WU AIPING2 citations58
US8288330B2Oct 16, 2012
Composition and method for photoresist removal
WU AIPING0 citations49
US8889609B2Nov 18, 2014
Cleaning formulations and method of using the cleaning formulations
WU AIPING1 citations45