Inventor
WAKIYA KAZUMASA
JP43 patents
⚠️ This page may combine multiple inventors who share the name “WAKIYA KAZUMASA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TOKYO OHKA KOGYO CO LTD
36 patentsUS5795702AAug 18, 1998
Photoresist stripping liquid compositions and a method of stripping photoresists using the same
TOKYO OHKA KOGYO CO LTD165 citations99
US5792274AAug 11, 1998
Remover solution composition for resist and method for removing resist using the same
TOKYO OHKA KOGYO CO LTD121 citations99
US5968848AOct 19, 1999
Process for treating a lithographic substrate and a rinse solution for the treatment
TOKYO OHKA KOGYO CO LTD97 citations98
US6638899B1Oct 28, 2003
Photoresist stripping solution and a method of stripping photoresists with the same
TOKYO OHKA KOGYO CO LTD62 citations96
US6261745B1Jul 17, 2001
Post-ashing treating liquid compositions and a process for treatment therewith
TOKYO OHKA KOGYO CO LTD71 citations96
US6068000AMay 30, 2000
Substrate treatment method
TOKYO OHKA KOGYO CO LTD62 citations96
US5905063AMay 18, 1999
Remover solution composition for resist and method for removing resist using the same
TOKYO OHKA KOGYO CO LTD81 citations96
US5863710AJan 26, 1999
Developer solution for photolithographic patterning
TOKYO OHKA KOGYO CO LTD56 citations96
US6136505AOct 24, 2000
Liquid coating composition for use in forming antireflective film and photoresist material using said antireflective film
TOKYO OHKA KOGYO CO LTD21 citations93
US5783362AJul 21, 1998
Liquid coating composition for use in forming photoresist coating films and a photoresist material using said composition
TOKYO OHKA KOGYO CO LTD27 citations93
US5631314AMay 20, 1997
Liquid coating composition for use in forming photoresist coating films and photoresist material using said composition
TOKYO OHKA KOGYO CO LTD36 citations93
US4944893AJul 31, 1990
Remover solution for resist
TOKYO OHKA KOGYO CO LTD32 citations93
US7371510B2May 13, 2008
Material for forming resist protecting film for use in liquid immersion lithography process, composite film, and method for forming resist pattern
TOKYO OHKA KOGYO CO LTD44 citations92
US6291142B1Sep 18, 2001
Photoresist stripping liquid compositions and a method of stripping photoresists using the same
TOKYO OHKA KOGYO CO LTD17 citations92
US6225034B1May 1, 2001
Photoresist stripping liquid compositions and a method of stripping photoresists using the same
TOKYO OHKA KOGYO CO LTD20 citations92
US6225030B1May 1, 2001
Post-ashing treating method for substrates
TOKYO OHKA KOGYO CO LTD22 citations92
US6218087B1Apr 17, 2001
Photoresist stripping liquid composition and a method of stripping photoresists using the same
TOKYO OHKA KOGYO CO LTD23 citations92
US7846637B2Dec 7, 2010
Material for forming resist protective film for use in liquid immersion lithography process and method for forming resist pattern using the protective film
TOKYO OHKA KOGYO CO LTD40 citations91
US6689535B2Feb 10, 2004
Anti-reflective coating composition, multilayer photoresist material using the same, and method for forming pattern
TOKYO OHKA KOGYO CO LTD14 citations84
US7795197B2Sep 14, 2010
Cleaning liquid for lithography and method for resist pattern formation
TOKYO OHKA KOGYO CO LTD10 citations83
US7741260B2Jun 22, 2010
Rinsing fluid for lithography
TOKYO OHKA KOGYO CO LTD12 citations83
US7442675B2Oct 28, 2008
Cleaning composition and method of cleaning semiconductor substrate
TOKYO OHKA KOGYO CO LTD12 citations82
US6132928AOct 17, 2000
Coating solution for forming antireflective coating film
TOKYO OHKA KOGYO CO LTD14 citations74
US8367312B2Feb 5, 2013
Detergent for lithography and method of forming resist pattern with the same
TOKYO OHKA KOGYO CO LTD5 citations72
US6599682B2Jul 29, 2003
Method for forming a finely patterned photoresist layer
TOKYO OHKA KOGYO CO LTD2 citations63
US6416930B2Jul 9, 2002
Composition for lithographic anti-reflection coating, and resist laminate using the same
TOKYO OHKA KOGYO CO LTD4 citations63
US11441101B2Sep 13, 2022
Cleaning composition, cleaning method, and method for manufacturing semiconductor
TOKYO OHKA KOGYO CO LTD1 citations62
US7897325B2Mar 1, 2011
Lithographic rinse solution and method for forming patterned resist layer using the same
TOKYO OHKA KOGYO CO LTD2 citations62
US7811748B2Oct 12, 2010
Resist pattern forming method and composite rinse agent
TOKYO OHKA KOGYO CO LTD2 citations62
US6734258B2May 11, 2004
Protective coating composition for dual damascene process
TOKYO OHKA KOGYO CO LTD5 citations62
US7238462B2Jul 3, 2007
Undercoating material for wiring, embedded material, and wiring formation method
TOKYO OHKA KOGYO CO LTD4 citations59
US7179399B2Feb 20, 2007
Material for forming protective film
TOKYO OHKA KOGYO CO LTD0 citations52
US6746963B2Jun 8, 2004
Method for processing coating film and method for manufacturing semiconductor element with use of the same method
TOKYO OHKA KOGYO CO LTD0 citations52
US12593639B2Mar 31, 2026
Method for processing substrate, chemical solution, and method for providing chemical solution
TOKYO OHKA KOGYO CO LTD0 citations51
US8354215B2Jan 15, 2013
Method for stripping photoresist
TOKYO OHKA KOGYO CO LTD1 citations51
US7129020B2Oct 31, 2006
Liquid coating composition for forming a top antireflective film and photoresist laminate using the same, as well as method for forming photoresist pattern
TOKYO OHKA KOGYO CO LTD1 citations51
YOKOI SHIGERU
3 patentsUS8192923B2Jun 5, 2012
Photoresist stripping solution and a method of stripping photoresists using the same
YOKOI SHIGERU3 citations61
US8685910B2Apr 1, 2014
Cleaning liquid used in photolithography and a method for treating substrate therewith
YOKOI SHIGERU1 citations51
US8158568B2Apr 17, 2012
Cleaning liquid used in process for forming dual damascene structure and a process for treating substrate therewith
YOKOI SHIGERU1 citations51