P

Inventor

NG PHILIP S

US28 patents
⚠️ This page may combine multiple inventors who share the name “NG PHILIP S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ATMEL CORP

24 patents
US6097657AAug 1, 2000

Method for reading out the contents of a serial memory

ATMEL CORP16 citations92
US6038185AMar 14, 2000

Method and apparatus for a serial access memory

ATMEL CORP35 citations92
US7848151B2Dec 7, 2010

Circuit to control voltage ramp rate

ATMEL CORP15 citations91
US7512008B2Mar 31, 2009

Circuit to control voltage ramp rate

ATMEL CORP16 citations91
US7881415B2Feb 1, 2011

Communication protocol method and apparatus for a single wire device

ATMEL CORP7 citations84
US7710105B2May 4, 2010

Circuit reset testing methods

ATMEL CORP8 citations84
US7180795B1Feb 20, 2007

Method of sensing an EEPROM reference cell

ATMEL CORP12 citations84
US7099202B1Aug 29, 2006

Y-mux splitting scheme

ATMEL CORP20 citations83
US7782240B2Aug 24, 2010

Device and method of supplying power to targets on single-wire interface

ATMEL CORP10 citations76
US7336540B2Feb 26, 2008

Indirect measurement of negative margin voltages in endurance testing of EEPROM cells

ATMEL CORP5 citations72
US6998884B2Feb 14, 2006

Circuit for auto-clamping input pins to a definite voltage during power-up or reset

ATMEL CORP8 citations71
US7982499B2Jul 19, 2011

Capacitive node isolation for electrostatic discharge circuit

ATMEL CORP4 citations62
US7307898B2Dec 11, 2007

Method and apparatus for implementing walkout of device junctions

ATMEL CORP6 citations62
US6815992B1Nov 9, 2004

Circuit for testing and fine tuning integrated circuit (switch control circuit)

ATMEL CORP5 citations61
US7257668B2Aug 14, 2007

Method and system for enhancing the endurance of memory cells

ATMEL CORP3 citations60
US7082490B2Jul 25, 2006

Method and system for enhancing the endurance of memory cells

ATMEL CORP3 citations60
US6891917B2May 10, 2005

Shift register with reduced area and power consumption

ATMEL CORP6 citations60
US7181650B2Feb 20, 2007

Fault tolerant data storage circuit

ATMEL CORP0 citations52
US7751248B2Jul 6, 2010

Indirect measurement of negative margin voltages in endurance testing of EEPROM cells

ATMEL CORP1 citations51
US9595335B2Mar 14, 2017

Memory device and systems and methods for selecting memory cells in the memory device

ATMEL CORP0 citations48
US9142306B2Sep 22, 2015

Selecting memory cells using source lines

ATMEL CORP1 citations48
US7868660B2Jan 11, 2011

Serial communications bus with active pullup

ATMEL CORP0 citations41
US7257046B2Aug 14, 2007

Memory data access scheme

ATMEL CORP0 citations40
US7102950B2Sep 5, 2006

Fuse data storage system using core memory

ATMEL CORP0 citations40

NG PHILIP S

4 patents