Inventor
NG PHILIP S
US28 patents
⚠️ This page may combine multiple inventors who share the name “NG PHILIP S”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ATMEL CORP
24 patentsUS6097657AAug 1, 2000
Method for reading out the contents of a serial memory
ATMEL CORP16 citations92
US6038185AMar 14, 2000
Method and apparatus for a serial access memory
ATMEL CORP35 citations92
US7848151B2Dec 7, 2010
Circuit to control voltage ramp rate
ATMEL CORP15 citations91
US7512008B2Mar 31, 2009
Circuit to control voltage ramp rate
ATMEL CORP16 citations91
US7881415B2Feb 1, 2011
Communication protocol method and apparatus for a single wire device
ATMEL CORP7 citations84
US7710105B2May 4, 2010
Circuit reset testing methods
ATMEL CORP8 citations84
US7180795B1Feb 20, 2007
Method of sensing an EEPROM reference cell
ATMEL CORP12 citations84
US7099202B1Aug 29, 2006
Y-mux splitting scheme
ATMEL CORP20 citations83
US7782240B2Aug 24, 2010
Device and method of supplying power to targets on single-wire interface
ATMEL CORP10 citations76
US7336540B2Feb 26, 2008
Indirect measurement of negative margin voltages in endurance testing of EEPROM cells
ATMEL CORP5 citations72
US6998884B2Feb 14, 2006
Circuit for auto-clamping input pins to a definite voltage during power-up or reset
ATMEL CORP8 citations71
US7982499B2Jul 19, 2011
Capacitive node isolation for electrostatic discharge circuit
ATMEL CORP4 citations62
US7307898B2Dec 11, 2007
Method and apparatus for implementing walkout of device junctions
ATMEL CORP6 citations62
US6815992B1Nov 9, 2004
Circuit for testing and fine tuning integrated circuit (switch control circuit)
ATMEL CORP5 citations61
US7257668B2Aug 14, 2007
Method and system for enhancing the endurance of memory cells
ATMEL CORP3 citations60
US7082490B2Jul 25, 2006
Method and system for enhancing the endurance of memory cells
ATMEL CORP3 citations60
US6891917B2May 10, 2005
Shift register with reduced area and power consumption
ATMEL CORP6 citations60
US7181650B2Feb 20, 2007
Fault tolerant data storage circuit
ATMEL CORP0 citations52
US7751248B2Jul 6, 2010
Indirect measurement of negative margin voltages in endurance testing of EEPROM cells
ATMEL CORP1 citations51
US9595335B2Mar 14, 2017
Memory device and systems and methods for selecting memory cells in the memory device
ATMEL CORP0 citations48
US9142306B2Sep 22, 2015
Selecting memory cells using source lines
ATMEL CORP1 citations48
US7868660B2Jan 11, 2011
Serial communications bus with active pullup
ATMEL CORP0 citations41
US7257046B2Aug 14, 2007
Memory data access scheme
ATMEL CORP0 citations40
US7102950B2Sep 5, 2006
Fuse data storage system using core memory
ATMEL CORP0 citations40
NG PHILIP S
4 patentsUS8107577B2Jan 31, 2012
Communication protocol method and apparatus for a single wire device
NG PHILIP S2 citations61
US8085604B2Dec 27, 2011
Snap-back tolerant integrated circuits
NG PHILIP S3 citations61
US8861666B2Oct 14, 2014
Communication protocol method and apparatus for a single wire device
NG PHILIP S0 citations50
US8828846B2Sep 9, 2014
Method of computing a width of a scribe region based on a bonding structure that extends into the scribe reigon in a wafer-level chip scale (WLCSP) packaging
NG PHILIP S0 citations40