Inventor
LIN CHUNG-KAI
TW15 patents
⚠️ This page may combine multiple inventors who share the name “LIN CHUNG-KAI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
8 patentsUS9477803B2Oct 25, 2016
Method of generating techfile having reduced corner variation value
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations84
US10521538B2Dec 31, 2019
Method and system for integrated circuit design with on-chip variation and spatial correlation
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations71
US10019545B2Jul 10, 2018
Simulation scheme including self heating effect
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations69
US9378314B2Jun 28, 2016
Analytical model for predicting current mismatch in metal oxide semiconductor arrays
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations61
US10216879B1Feb 26, 2019
Method for establishing aging model of device and analyzing aging state of device with aging model
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations58
US12336258B2Jun 17, 2025
Semiconductor structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations54
US10169506B2Jan 1, 2019
Circuit design method and system
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US10860769B2Dec 8, 2020
Method and system for integrated circuit design with on-chip variation and spatial correlation
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations50
TAIWAN SEMICONDUCTOR MFG
5 patentsUS8001494B2Aug 16, 2011
Table-based DFM for accurate post-layout analysis
TAIWAN SEMICONDUCTOR MFG16 citations92
US9245073B2Jan 26, 2016
Pattern density-dependent mismatch modeling flow
TAIWAN SEMICONDUCTOR MFG4 citations72
US6800496B1Oct 5, 2004
Characterization methodology for the thin gate oxide device
TAIWAN SEMICONDUCTOR MFG2 citations58
US8832619B2Sep 9, 2014
Analytical model for predicting current mismatch in metal oxide semiconductor arrays
TAIWAN SEMICONDUCTOR MFG1 citations51
US9317647B2Apr 19, 2016
Method of designing a circuit and system for implementing the method
TAIWAN SEMICONDUCTOR MFG0 citations50