Inventor

OMOTE KAZUHIKO

JP51 patents

⚠️ This page may combine multiple inventors who share the name “OMOTE KAZUHIKO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

OMOTE KAZUHIKO

RIGAKU DENKI CO LTD

X-ray thin film inspection device

Target for X-ray generator, method of manufacturing the same and X-ray generator

X-ray thin film inspection device

X-ray diffraction apparatus

Soller slit and X-ray apparatus

Apparatus for x-ray analysis

Method and apparatus for film thickness measurement

Fluorescent X-ray analysis apparatus comprising a plurality of X-ray detectors and an X-ray irradiation unit including a multi-wavelength mirror

Method and apparatus for X-ray reflectance measurement

Method for analyzing film structure and apparatus therefor

X-ray small angle optical system

X-ray topography apparatus

Method and apparatus for measuring thin film, and thin film deposition system

Method of estimating preferred orientation of polycrystalline material

X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve

X-ray topography apparatus

Pole measuring method

Non-uniform density sample analyzing method, device and system

Density-nonuniform multilayer film analyzing method, and apparatus and system thereof

Hybrid inspection system

Grazing incidence x-ray fluorescence spectrometer and grazing incidence x-ray fluorescence analyzing method

Fluorescent x-ray analyzing method and apprartus

X-ray generator and x-ray analysis device

X-ray diffractometer with multilayer reflection-type monochromator

Beam generation unit and X-ray small-angle scattering apparatus

X-ray inspection device

Soller slit, X-ray diffraction apparatus, and method

Analysis method for fine structure, and apparatus and program thereof

Analysis method for fine structure, apparatus, and program

Method for analyzing membrane structure and apparatus therefor

Method for X-ray reflectance measurement

Damage measurement method, apparatus and program, and x-ray diffraction apparatus

Transmissive small-angle scattering device

Transmissive small-angle scattering device

Transmissive small-angle scattering device

Method for measuring dead time of X-ray detector

X-ray generating apparatus

Method of performing analysis using propagation rays and apparatus for performing the same

Scattering measurement analysis method, scattering measurement analysis device, and non-transitory computer-readable storage medium storing scattering measurement analysis program

X-ray intensity correction method and X-ray diffractometer

Total reflection x-ray fluorescence spectrometer

Imaging type X-ray microscope

X-ray imaging apparatus, and X-ray imaging method

OMOTE KAZUHIKO

Surface microstructure measurement method, surface microstructure measurement data analysis method and X-ray scattering measurement device

Method for X-ray wavelength measurement and X-ray wavelength measurement apparatus

X-ray scattering measurement device and X-ray scattering measurement method

X-ray image photographing method and X-ray image photographing apparatus

JAPAN SCIENCE & TECH CORP

Combinatorial X-ray diffractor

OZAWA TETSUYA

X-ray apparatus, method of using the same and X-ray irradiation method

KANI TETSUO

Motion control system and X-ray measurement apparatus