Inventor

NEGISHI KAZUKI

US18 patents

⚠️ This page may combine multiple inventors who share the name “NEGISHI KAZUKI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

NEGISHI KAZUKI

FORMFACTOR INC

Probe systems and methods for testing a device under test

Probe systems and methods including electric contact detection

Probe systems and methods for characterizing optical coupling between an optical probe of a probe system and a calibration structure

Probe systems including imaging devices with objective lens isolators, and related methods

Probe systems for optically probing a device under test and methods of operating the probe systems

Calibration chucks for optical probe systems, optical probe systems including the calibration chucks, and methods of utilizing the optical probe systems

CASCADE MICROTECH INC

Probe systems and methods including electric contact detection

High voltage chuck for a probe station

High voltage chuck for a probe station

Systems and methods for on-wafer dynamic testing of electronic devices

Shielded probe systems

FORMFACTOR BEAVERTON INC

Probe systems and methods for calibrating capacitive height sensing measurements

Probes with fiducial targets, probe systems including the same, and associated methods

Probe systems for testing a device under test

NEGISHI KAZUKI

Test apparatus for measuring a characteristic of a device under test

Low noise connector with cables having a center, middle and outer conductors

BOLT BRYAN

Systems and methods for simultaneous optical testing of a plurality of devices under test

SIMMONS MICHAEL E

High voltage chuck for a probe station