P

Inventor

IIZUMI TAKASHI

JP35 patents
⚠️ This page may combine multiple inventors who share the name “IIZUMI TAKASHI”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

HITACHI LTD

18 patents
US6627888B2Sep 30, 2003

Scanning electron microscope

HITACHI LTD30 citations96
US6708072B2Mar 16, 2004

Remote maintenance method, industrial device, and semiconductor device

HITACHI LTD32 citations95
US7236651B2Jun 26, 2007

Image evaluation method and microscope

HITACHI LTD16 citations93
US7095884B2Aug 22, 2006

Method and apparatus for circuit pattern inspection

HITACHI LTD22 citations93
US6909930B2Jun 21, 2005

Method and system for monitoring a semiconductor device manufacturing process

HITACHI LTD52 citations93
US7551976B2Jun 23, 2009

Industrial device receiving remote maintenance operation and outputting charge information

HITACHI LTD12 citations92
US4907287AMar 6, 1990

Image correction system for scanning electron microscope

HITACHI LTD55 citations91
US7369703B2May 6, 2008

Method and apparatus for circuit pattern inspection

HITACHI LTD10 citations84
US7340111B2Mar 4, 2008

Image evaluation method and microscope

HITACHI LTD6 citations74
US6803573B2Oct 12, 2004

Scanning electron microscope

HITACHI LTD6 citations74
US7047096B2May 16, 2006

Remote maintenance method, industrial device, and semiconductor device

HITACHI LTD6 citations73
US6954677B2Oct 11, 2005

Remote maintenance method for industrial device that generates maintenance charge information using received charge list

HITACHI LTD4 citations73
US6862485B2Mar 1, 2005

Remote maintenance method, industrial device, and semiconductor device

HITACHI LTD6 citations73
US6792325B2Sep 14, 2004

Remote maintenance method, industrial device, and semiconductor device

HITACHI LTD6 citations73
US7805023B2Sep 28, 2010

Image evaluation method and microscope

HITACHI LTD3 citations63
US7439505B2Oct 21, 2008

Scanning electron microscope

HITACHI LTD2 citations63
US7002151B2Feb 21, 2006

Scanning electron microscope

HITACHI LTD2 citations63
US7177715B2Feb 13, 2007

Remote maintenance method for generating maintenance charge information, industrial device, and semiconductor device

HITACHI LTD0 citations51

HITACHI HIGH TECH CORP

10 patents

FUJIFILM CORP

6 patents

YAMAGUCHI SATORU

1 patent