Inventor
TSUJII TOSHIYUKI
JP8 patents
Patents
8 patentsUS6489791B1Dec 3, 2002
Build off self-test (Bost) testing method
MITSUBISHI ELECTRIC CORP23 citations91
US6300577B1Oct 9, 2001
Film carrier and method of burn-in testing
MITSUBISHI ELECTRIC CORP29 citations91
US5894172AApr 13, 1999
Semiconductor device with identification function
MITSUBISHI ELECTRIC CORP26 citations91
US6519728B2Feb 11, 2003
Semiconductor integrated circuit having test circuit
MITSUBISHI ELECTRIC CORP22 citations90
US6351836B1Feb 26, 2002
Semiconductor device with boundary scanning circuit
MITSUBISHI ELECTRIC CORP15 citations82
US6486691B2Nov 26, 2002
Tester for a semiconductor IC circuit having multiple pins
MITSUBISHI ELECTRIC CORP10 citations72
US6006350ADec 21, 1999
Semiconductor device testing apparatus and method for testing memory and logic sections of a semiconductor device
MITSUBISHI ELECTRIC CORP15 citations72
US6393593B1May 21, 2002
Tester and method for testing LSI designed for scan method
MITSUBISHI ELECTRIC CORP6 citations61