Inventor
TADA TETSUO
JP14 patents
⚠️ This page may combine multiple inventors who share the name “TADA TETSUO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
MITSUBISHI ELECTRIC CORP
13 patentsUS4961052AOct 2, 1990
Probing plate for wafer testing
MITSUBISHI ELECTRIC CORP141 citations97
US5436559AJul 25, 1995
Method for testing semiconductor device
MITSUBISHI ELECTRIC CORP45 citations96
US5266894ANov 30, 1993
Apparatus and method for testing semiconductor device
MITSUBISHI ELECTRIC CORP55 citations96
US5055780AOct 8, 1991
Probe plate used for testing a semiconductor device, and a test apparatus therefor
MITSUBISHI ELECTRIC CORP72 citations95
US5042148AAug 27, 1991
Method of manufacturing a probing card for wafer testing
MITSUBISHI ELECTRIC CORP47 citations94
US5894172AApr 13, 1999
Semiconductor device with identification function
MITSUBISHI ELECTRIC CORP26 citations91
US4983908AJan 8, 1991
Probing card for wafer testing and method of manufacturing the same
MITSUBISHI ELECTRIC CORP34 citations91
US4888715ADec 19, 1989
Semiconductor test system
MITSUBISHI ELECTRIC CORP18 citations73
US4813043AMar 14, 1989
Semiconductor test device
MITSUBISHI ELECTRIC CORP12 citations73
US4807229AFeb 21, 1989
Semiconductor device tester
MITSUBISHI ELECTRIC CORP18 citations73
US4801871AJan 31, 1989
Testing apparatus for semiconductor device
MITSUBISHI ELECTRIC CORP13 citations73
US4720671AJan 19, 1988
Semiconductor device testing device
MITSUBISHI ELECTRIC CORP18 citations72
US4873686AOct 10, 1989
Test assist circuit for a semiconductor device providing fault isolation
MITSUBISHI ELECTRIC CORP4 citations62