Inventor
DO NHON T
US6 patents
Patents
6 patentsUS6396296B1May 28, 2002
Method and apparatus for electrical characterization of an integrated circuit package using a vertical probe station
ADVANCED MICRO DEVICES INC115 citations95
US6512675B1Jan 28, 2003
Heat sink grounded to a grounded package lid
ADVANCED MICRO DEVICES INC43 citations89
US6384618B1May 7, 2002
Chip scale electrical test fixture with isolation plate having an angled test hole
ADVANCED MICRO DEVICES INC24 citations88
US6531774B1Mar 11, 2003
Chip scale electrical test fixture with isolation plate having a recess
ADVANCED MICRO DEVICES INC16 citations81
US6476625B1Nov 5, 2002
Method for determining coplanarity of electrical contact of BGA type packages prior to electrical characterization
ADVANCED MICRO DEVICES INC7 citations71
US6424140B1Jul 23, 2002
Chip scale electrical test fixture
ADVANCED MICRO DEVICES INC1 citations50