P

Inventor

NAHUM MICHAEL

US48 patents
⚠️ This page may combine multiple inventors who share the name “NAHUM MICHAEL”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

MITUTOYO CORP

42 patents
US6487787B1Dec 3, 2002

System and method for determination of error parameters for performing self-calibration and other functions without an external position reference in a transducer

MITUTOYO CORP76 citations96
US6335618B1Jan 1, 2002

Position transducer having position-dependent amplitude encoding applying first and second modulations

MITUTOYO CORP67 citations96
US10751883B2Aug 25, 2020

Robot system with supplementary metrology position coordinates determination system

MITUTOYO CORP26 citations94
US6781694B2Aug 24, 2004

Two-dimensional scale structures and method usable in an absolute position transducer

MITUTOYO CORP78 citations94
US6664535B1Dec 16, 2003

Scale structures and methods usable in an absolute position transducer

MITUTOYO CORP64 citations94
US7065258B2Jun 20, 2006

Systems and methods for reducing accumulated systematic errors in image correlation displacement sensing systems

MITUTOYO CORP25 citations93
US6996291B2Feb 7, 2006

Systems and methods for correlating images in an image correlation system with reduced computational loads

MITUTOYO CORP27 citations93
US7894079B1Feb 22, 2011

Linear displacement sensor using a position sensitive photodetector

MITUTOYO CORP35 citations92
US7088441B2Aug 8, 2006

Method and apparatus for measuring wavelength changes in a high-resolution measurement system

MITUTOYO CORP22 citations92
US6937349B2Aug 30, 2005

Systems and methods for absolute positioning using repeated quasi-random pattern

MITUTOYO CORP33 citations92
US10871366B2Dec 22, 2020

Supplementary metrology position coordinates determination system for use with a robot

MITUTOYO CORP8 citations84
US10171725B1Jan 1, 2019

Variable focal length lens system including a focus state reference subsystem

MITUTOYO CORP10 citations84
US9835473B2Dec 5, 2017

Absolute electromagnetic position encoder

MITUTOYO CORP18 citations84
US9778072B1Oct 3, 2017

Absolute electromagnetic position encoder

MITUTOYO CORP12 citations84
US9618366B2Apr 11, 2017

Absolute encoder scale configuration with unique coded impedance modulations

MITUTOYO CORP15 citations84
US7873488B2Jan 18, 2011

On-site calibration method and object for chromatic point sensors

MITUTOYO CORP10 citations84
US7432496B1Oct 7, 2008

Encoder scale writing or calibration at an end-use installation based on correlation sensing

MITUTOYO CORP11 citations84
US7400414B2Jul 15, 2008

Hand-size structured-light three-dimensional metrology imaging system and method

MITUTOYO CORP13 citations84
US7333219B2Feb 19, 2008

Handheld metrology imaging system and method

MITUTOYO CORP9 citations84
US7085431B2Aug 1, 2006

Systems and methods for reducing position errors in image correlation systems during intra-reference-image displacements

MITUTOYO CORP16 citations84
US6992778B2Jan 31, 2006

Method and apparatus for self-calibration of a tunable-source phase shifting interferometer

MITUTOYO CORP18 citations84
US6990254B2Jan 24, 2006

Systems and methods for correlating images in an image correlation system with reduced computational loads

MITUTOYO CORP17 citations84
US6873422B2Mar 29, 2005

Systems and methods for high-accuracy displacement determination in a correlation based position transducer

MITUTOYO CORP18 citations84
US10281700B1May 7, 2019

Variable focal length lens system including a focus state reference subsystem

MITUTOYO CORP13 citations83
US8898923B2Dec 2, 2014

System and method for setting measurement force thresholds in a force sensing caliper

MITUTOYO CORP8 citations82
US12174005B2Dec 24, 2024

Metrology system with position and orientation tracking utilizing light beams

MITUTOYO CORP3 citations74
US11002529B2May 11, 2021

Robot system with supplementary metrology position determination system

MITUTOYO CORP5 citations73
US10584955B2Mar 10, 2020

Combined workpiece holder and calibration profile configuration for precision surface profile measurement

MITUTOYO CORP2 citations73
US7075097B2Jul 11, 2006

Optical path array and angular filter for translation and orientation sensing

MITUTOYO CORP8 citations73
US10913156B2Feb 9, 2021

Robot system with end tool metrology position coordinates determination system

MITUTOYO CORP5 citations72
US9631913B2Apr 25, 2017

Calibration control device for metrology tools

MITUTOYO CORP2 citations72
US8689127B1Apr 1, 2014

Edge measurement video tool parameter-setting user interface

MITUTOYO CORP5 citations72
US11745354B2Sep 5, 2023

Supplementary metrology position coordinates determination system including an alignment sensor for use with a robot

MITUTOYO CORP3 citations71
US8931185B2Jan 13, 2015

Electronic caliper configured to generate power for measurement operations

MITUTOYO CORP4 citations70
US6905258B2Jun 14, 2005

Miniature imaging encoder readhead using fiber optic receiver channels

MITUTOYO CORP5 citations63
US9021715B2May 5, 2015

Electronic caliper configured to generate power for measurement operations

MITUTOYO CORP2 citations60
US7707738B2May 4, 2010

Digital ruler with low-friction sliding contact

MITUTOYO CORP2 citations59
US12536691B2Jan 27, 2026

Machine vision system utilizing measurement marking device

MITUTOYO CORP0 citations52
US12548180B2Feb 10, 2026

Hole diameter measuring device

MITUTOYO CORP0 citations47
US10527397B2Jan 7, 2020

Cooperative measurement gauge system for multiple axis position measurement

MITUTOYO CORP0 citations42
US10068465B2Sep 4, 2018

Battery-less data transmission module accessory for portable and handheld metrology devices

MITUTOYO CORP0 citations42
US9177222B2Nov 3, 2015

Edge measurement video tool and interface including automatic parameter set alternatives

MITUTOYO CORP0 citations41

NAHUM MICHAEL

2 patents

BRYLL ROBERT K

1 patent

US ARMY

1 patent

ISIS INNOVATION

1 patent

SESKO DAVID WILLIAM

1 patent