Inventor
WORSTER BRUCE W
US9 patents
⚠️ This page may combine multiple inventors who share the name “WORSTER BRUCE W”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
ULTRAPOINTE CORP
6 patentsUS6288782B1Sep 11, 2001
Method for characterizing defects on semiconductor wafers
ULTRAPOINTE CORP110 citations98
US5963314AOct 5, 1999
Laser imaging system for inspection and analysis of sub-micron particles
ULTRAPOINTE CORP258 citations98
US5479252ADec 26, 1995
Laser imaging system for inspection and analysis of sub-micron particles
ULTRAPOINTE CORP343 citations98
US5808735ASep 15, 1998
Method for characterizing defects on semiconductor wafers
ULTRAPOINTE CORP146 citations97
US5923430AJul 13, 1999
Method for characterizing defects on semiconductor wafers
ULTRAPOINTE CORP63 citations96
US6167148ADec 26, 2000
Method and system for inspecting the surface of a wafer
ULTRAPOINTE CORP37 citations86
KLA TENCOR CORP
3 patentsUS6661515B2Dec 9, 2003
Method for characterizing defects on semiconductor wafers
KLA TENCOR CORP42 citations96
US7384806B2Jun 10, 2008
Method for characterizing defects on semiconductor wafers
KLA TENCOR CORP9 citations84
US7154605B2Dec 26, 2006
Method for characterizing defects on semiconductor wafers
KLA TENCOR CORP10 citations73