Inventor

LEE KEN K

US21 patents

⚠️ This page may combine multiple inventors who share the name “LEE KEN K”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LEE KEN K

ULTRAPOINTE CORP

Method for characterizing defects on semiconductor wafers

Laser imaging system for inspection and analysis of sub-micron particles

Automated surface acquisition for a confocal microscope

Laser imaging system for inspection and analysis of sub-micron particles

Method for characterizing defects on semiconductor wafers

Method and apparatus for automatic focusing of a confocal laser microscope

Method for characterizing defects on semiconductor wafers

Method and apparatus for automatically focusing a microscope

Aperture optimization method providing improved defect detection and characterization

Surface extraction from a three-dimensional data set

INTEL CORP

Multiple phase switching regulator circuits sensing voltages across respective inductances

Voltage regulator having an inductive current sensing element

Fixture to couple an integrated circuit to a circuit board

Voltage regulation system having an inductive current sensing element

KLA TENCOR CORP

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers

Method for characterizing defects on semiconductor wafers

CORE TECH OPTICAL INC

Defect review system with 2D scanning and a ring detector

UNIPHASE CORP

Integrated laser imaging and spectral analysis system

(unassigned)

Method and apparatus for performing an automatic focus operation for a microscope

CORETECH OPTICAL INC

Surface inspection system