Inventor
YOSHIDA TAKAHO
JP15 patents
⚠️ This page may combine multiple inventors who share the name “YOSHIDA TAKAHO”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH CORP
10 patentsUS7223983B2May 29, 2007
Charged particle beam column
HITACHI HIGH TECH CORP35 citations92
US6982427B2Jan 3, 2006
Electron beam apparatus with aberration corrector
HITACHI HIGH TECH CORP18 citations92
US7211804B2May 1, 2007
Chromatic aberration corrector for charged particles and charged-particle optical apparatus using the corrector
HITACHI HIGH TECH CORP16 citations84
US7619218B2Nov 17, 2009
Charged particle optical apparatus with aberration corrector
HITACHI HIGH TECH CORP12 citations83
US7825377B2Nov 2, 2010
Electron beam apparatus with aberration corrector
HITACHI HIGH TECH CORP6 citations74
US7375323B2May 20, 2008
Electron beam apparatus with aberration corrector
HITACHI HIGH TECH CORP4 citations74
US7199365B2Apr 3, 2007
Electron beam apparatus with aberration corrector
HITACHI HIGH TECH CORP4 citations74
US7531799B2May 12, 2009
Charged particle beam column
HITACHI HIGH TECH CORP7 citations73
US9484182B2Nov 1, 2016
Charged-particle-beam device and method for correcting aberration
HITACHI HIGH TECH CORP1 citations50
US10217602B2Feb 26, 2019
Charged particle beam apparatus and aberration corrector
HITACHI HIGH TECH CORP0 citations41
HITACHI LTD
3 patentsUS7732766B2Jun 8, 2010
Method for measuring information transfer limit in transmission electron microscope, and transmission electron microscope using the same
HITACHI LTD3 citations62
US8035086B2Oct 11, 2011
Aberration correction apparatus that corrects spherical aberration of charged particle apparatus
HITACHI LTD4 citations60
US7319225B2Jan 15, 2008
Transmission electron microscope
HITACHI LTD1 citations51