Inventor
SCHULTZ J ALBERT
US34 patents
⚠️ This page may combine multiple inventors who share the name “SCHULTZ J ALBERT”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
IONWERKS INC
20 patentsUS7223969B2May 29, 2007
Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
IONWERKS INC43 citations95
US6992284B2Jan 31, 2006
Ion mobility TOF/MALDI/MS using drift cell alternating high and low electrical field regions
IONWERKS INC50 citations95
US7084393B2Aug 1, 2006
Fast time-of-flight mass spectrometer with improved data acquisition system
IONWERKS INC54 citations94
US7745780B2Jun 29, 2010
Multiplex data acquisition modes for ion mobility-mass spectrometry
IONWERKS INC23 citations92
US7547878B2Jun 16, 2009
Neutral/Ion reactor in adiabatic supersonic gas flow for ion mobility time-of-flight mass spectrometry
IONWERKS INC44 citations92
US7164122B2Jan 16, 2007
Ion mobility spectrometer
IONWERKS INC38 citations92
US7800054B2Sep 21, 2010
Fast time-of-flight mass spectrometer with improved dynamic range
IONWERKS INC21 citations91
US7629576B2Dec 8, 2009
Gold implantation/deposition of biological samples for laser desorption two and three dimensional depth profiling of biological tissues
IONWERKS INC28 citations91
US7482582B2Jan 27, 2009
Multi-beam ion mobility time-of-flight mass spectrometry with multi-channel data recording
IONWERKS INC16 citations90
US6989528B2Jan 24, 2006
Gold implantation/deposition of biological samples for laser desorption three dimensional depth profiling of tissues
IONWERKS INC40 citations90
US7429729B2Sep 30, 2008
Multi-beam ion mobility time-of-flight mass spectrometer with bipolar ion extraction and zwitterion detection
IONWERKS INC27 citations89
US7145134B2Dec 5, 2006
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions
IONWERKS INC11 citations83
US7084395B2Aug 1, 2006
Time-of-flight mass spectrometer for monitoring of fast processes
IONWERKS INC16 citations83
US9297761B2Mar 29, 2016
Nanoparticulate assisted nanoscale molecular imaging by mass spectrometery
IONWERKS INC4 citations82
US7291834B2Nov 6, 2007
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions
IONWERKS INC10 citations82
US11391681B2Jul 19, 2022
Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry
IONWERKS INC0 citations61
US8558168B2Oct 15, 2013
Post-ionization of neutrals for ion mobility oTOFMS identification of molecules and elements desorbed from surfaces
IONWERKS INC2 citations61
US8384023B2Feb 26, 2013
Post-ionization of neutrals for ion mobility oTOFMS identification of molecules and elements desorbed from surfaces
IONWERKS INC4 citations61
US10876982B2Dec 29, 2020
Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry
IONWERKS INC0 citations50
US10446383B2Oct 15, 2019
Nanoparticulate assisted nanoscale molecular imaging by mass spectrometry
IONWERKS INC0 citations50
SCHULTZ J ALBERT
5 patentsUS5087815AFeb 11, 1992
High resolution mass spectrometry of recoiled ions for isotopic and trace elemental analysis
SCHULTZ J ALBERT95 citations95
US8614416B2Dec 24, 2013
Nonoparticulate assisted nanoscale molecular imaging by mass spectrometery
SCHULTZ J ALBERT5 citations82
US8829428B2Sep 9, 2014
Time-of-flight spectrometry and spectroscopy of surfaces
SCHULTZ J ALBERT2 citations61
US8129675B2Mar 6, 2012
Neutral/ion reactor in adiabatic supersonic gas flow for ion mobility time-of-flight mass spectrometry
SCHULTZ J ALBERT5 citations58
US8519329B2Aug 27, 2013
Time-of-flight mass spectrometry of surfaces
SCHULTZ J ALBERT0 citations50
IONWERKS
3 patentsUS6747271B2Jun 8, 2004
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisition
IONWERKS46 citations95
US7365313B2Apr 29, 2008
Fast time-of-flight mass spectrometer with improved data acquisition system
IONWERKS31 citations91
US6909090B2Jun 21, 2005
Multi-anode detector with increased dynamic range for time-of-flight mass spectrometers with counting data acquisitions
IONWERKS17 citations91