Inventor
JANSSEN BART JOZEF
NL23 patents
Patents
23 patentsUS11756762B2Sep 12, 2023
Rotating sample holder for random angle sampling in tomography
FEI CO2 citations70
US11257656B2Feb 22, 2022
Rotating sample holder for random angle sampling in tomography
FEI CO3 citations70
US10937625B2Mar 2, 2021
Method of imaging a sample using an electron microscope
FEI CO4 citations70
US10122946B2Nov 6, 2018
Method for detecting particulate radiation
FEI CO2 citations69
US10014158B1Jul 3, 2018
Innovative image processing in charged particle microscopy
FEI CO5 citations65
US12009176B2Jun 11, 2024
Method and system for generating a diffraction image
FEI CO0 citations62
US11694874B2Jul 4, 2023
Method and system for generating a diffraction image
FEI CO0 citations62
US11417498B2Aug 16, 2022
Method of manufacturing a charged particle detector
FEI CO1 citations62
US11990315B2May 21, 2024
Measurement and correction of optical aberrations in charged particle beam microscopy
FEI CO0 citations60
US11742175B2Aug 29, 2023
Defective pixel management in charged particle microscopy
FEI CO0 citations60
US10665419B2May 26, 2020
Intelligent pre-scan in scanning transmission charged particle microscopy
FEI CO1 citations60
US8817148B2Aug 26, 2014
Method for acquiring data with an image sensor
FEI CO3 citations60
US8766214B2Jul 1, 2014
Method of preparing and imaging a lamella in a particle-optical apparatus
FEI CO3 citations60
US12074007B2Aug 27, 2024
Rotating sample holder for random angle sampling in tomography
FEI CO0 citations59
US10825647B2Nov 3, 2020
Innovative imaging technique in transmission charged particle microscopy
FEI CO1 citations58
US9202670B2Dec 1, 2015
Method of investigating the wavefront of a charged-particle beam
FEI CO3 citations57
US11551906B1Jan 10, 2023
Time-gated detection, dual-layer SPAD-based electron detection
FEI CO0 citations53
US11297276B1Apr 5, 2022
Method and system for high speed signal processing
FEI CO0 citations51
US10008363B2Jun 26, 2018
Method of imaging a specimen using ptychography
FEI CO1 citations51
US10389955B2Aug 20, 2019
Method for detecting particulate radiation
FEI CO0 citations48
US12165835B2Dec 10, 2024
Stroboscopic illumination synchronized electron detection and imaging
FEI CO0 citations47
US10692691B2Jun 23, 2020
Pulse processing
FEI CO0 citations43
US10403470B2Sep 3, 2019
Pulse processing
FEI CO0 citations43