Inventor
FOORD DAVID
US4 patents
Patents
4 patentsUS8766214B2Jul 1, 2014
Method of preparing and imaging a lamella in a particle-optical apparatus
FEI CO3 citations60
US9514913B2Dec 6, 2016
TEM sample mounting geometry
FEI CO2 citations55
US10325754B2Jun 18, 2019
Ion implantation to alter etch rate
FEI CO0 citations48
US9618460B2Apr 11, 2017
Method of performing tomographic imaging of a sample in a charged-particle microscope
FEI CO1 citations48