Inventor
ASAHATA TATSUYA
JP52 patents
⚠️ This page may combine multiple inventors who share the name “ASAHATA TATSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
HITACHI HIGH TECH SCIENCE CORP
41 patentsUS10088401B2Oct 2, 2018
Automatic sample preparation apparatus
HITACHI HIGH TECH SCIENCE CORP14 citations92
US10677697B2Jun 9, 2020
Automatic sample preparation apparatus
HITACHI HIGH TECH SCIENCE CORP5 citations84
US9347896B2May 24, 2016
Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
HITACHI HIGH TECH SCIENCE CORP8 citations84
US9275827B2Mar 1, 2016
Charged particle beam apparatus having needle probe that tracks target position changes
HITACHI HIGH TECH SCIENCE CORP7 citations84
US9111717B2Aug 18, 2015
Ion beam apparatus
HITACHI HIGH TECH SCIENCE CORP7 citations84
US11073453B2Jul 27, 2021
Automatic sample preparation apparatus and automatic sample preparation method
HITACHI HIGH TECH SCIENCE CORP2 citations73
US10236159B2Mar 19, 2019
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP3 citations73
US9966226B2May 8, 2018
Cross-section processing and observation method and cross-section processing and observation apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations73
US9934938B2Apr 3, 2018
Focused ion beam apparatus, method for observing cross-section of sample by using the same, and storage medium
HITACHI HIGH TECH SCIENCE CORP3 citations73
US8637819B2Jan 28, 2014
Cross-section processing and observation apparatus
HITACHI HIGH TECH SCIENCE CORP5 citations73
US11282672B2Mar 22, 2022
Charged particle beam apparatus and sample processing observation method
HITACHI HIGH TECH SCIENCE CORP1 citations63
US9269539B2Feb 23, 2016
Focused ion beam apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations63
US8822911B2Sep 2, 2014
Focused ion beam apparatus and method of adjusting ion beam optics
HITACHI HIGH TECH SCIENCE CORP3 citations63
US11835438B2Dec 5, 2023
Automatic sample preparation apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations62
US9202671B2Dec 1, 2015
Charged particle beam apparatus and sample processing method using charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US9080945B2Jul 14, 2015
Cross-section processing and observation method and cross-section processing and observation apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US8642980B2Feb 4, 2014
Composite charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations62
US9336987B2May 10, 2016
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP2 citations61
US11742177B2Aug 29, 2023
Charged particle beam apparatus and control method thereof
HITACHI HIGH TECH SCIENCE CORP0 citations59
US11361936B2Jun 14, 2022
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations59
US11177113B2Nov 16, 2021
Charged particle beam apparatus and control method thereof
HITACHI HIGH TECH SCIENCE CORP0 citations59
US11749493B2Sep 5, 2023
Liquid metal ion source and focused ion beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations57
US11114276B2Sep 7, 2021
Apparatus, method, and program for processing and observing cross section, and method of measuring shape
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10658147B2May 19, 2020
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10636615B2Apr 28, 2020
Composite beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10204759B2Feb 12, 2019
Composite beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10096449B2Oct 9, 2018
Cross-section processing-and-observation method and cross-section processing-and-observation apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US9368323B2Jun 14, 2016
Charged particle beam device, control method for charged particle beam device, and cross-section processing observation apparatus
HITACHI HIGH TECH SCIENCE CORP1 citations52
US9245713B2Jan 26, 2016
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations52
US9218937B2Dec 22, 2015
Charged particle beam apparatus having improved needle movement control
HITACHI HIGH TECH SCIENCE CORP0 citations52
US10622187B2Apr 14, 2020
Charged particle beam apparatus and sample processing observation method
HITACHI HIGH TECH SCIENCE CORP0 citations51
US9218939B2Dec 22, 2015
Focused ion beam system, sample processing method using the same, and sample processing program using focused ion beam
HITACHI HIGH TECH SCIENCE CORP0 citations50
US11482398B2Oct 25, 2022
Focused ion beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations49
US11239046B2Feb 1, 2022
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations49
US10485087B2Nov 19, 2019
Portable information terminal, beam irradiation system, and program
HITACHI HIGH TECH SCIENCE CORP0 citations49
US11424100B2Aug 23, 2022
Charged particle beam irradiation apparatus and control method
HITACHI HIGH TECH SCIENCE CORP0 citations48
US11335534B2May 17, 2022
Particle beam irradiation apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations48
US10014155B2Jul 3, 2018
Microsample stage and method of manufacturing the same
HITACHI HIGH TECH SCIENCE CORP0 citations45
US10832890B2Nov 10, 2020
Charged particle beam device
HITACHI HIGH TECH SCIENCE CORP0 citations42
US10629411B2Apr 21, 2020
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations42
US9318303B2Apr 19, 2016
Charged particle beam apparatus
HITACHI HIGH TECH SCIENCE CORP0 citations41
HITACHI HIGH-TECH SCIENCE CORP
3 patentsUS9620333B2Apr 11, 2017
Charged particle beam apparatus
HITACHI HIGH-TECH SCIENCE CORP9 citations84
US9548185B2Jan 17, 2017
Cross section processing method and cross section processing apparatus
HITACHI HIGH-TECH SCIENCE CORP4 citations73
US9455119B2Sep 27, 2016
Charged particle beam apparatus
HITACHI HIGH-TECH SCIENCE CORP0 citations41
SII NANOTECHNOLOGY INC
3 patentsUS6825468B2Nov 30, 2004
Fine stencil structure correction device
SII NANOTECHNOLOGY INC12 citations73
US7518109B2Apr 14, 2009
Method and apparatus of measuring thin film sample and method and apparatus of fabricating thin film sample
SII NANOTECHNOLOGY INC3 citations63
US7459699B2Dec 2, 2008
Method of determining processing position in charged particle beam apparatus, and infrared microscope used in the method
SII NANOTECHNOLOGY INC4 citations63
MAN XIN
1 patentUEMOTO ATSUSHI
1 patentYAMAMOTO YO
1 patentShowing the top 50 of 52 patents by PatentIndex Score.