Inventor

DMITRIEV VLADIMIR

IL30 patents

⚠️ This page may combine multiple inventors who share the name “DMITRIEV VLADIMIR”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

DMITRIEV VLADIMIR

DMITRIEV VLADIMIR

Correction of errors of a photolithographic mask using a joint optimization process

Method and apparatus for the determination of laser correcting tool parameters

Analyses of measurement data

Method and apparatus for locally deforming an optical element for photolithography

Global landmark method for critical dimension uniformity reconstruction

ZEISS CARL SMS LTD

Method and apparatus for generating a predetermined three-dimensional contour of an optical component and/or a wafer

Method and apparatus for determining positions of a plurality of pixels to be introduced in a substrate of a photolithographic mask

Apparatus and method for imparting direction-selective light attenuation

Method and apparatus for compensating at least one defect of an optical system

Method and apparatus for determining an effect of one or more pixels to be introduced into a substrate of a photolithographic mask

ZEISS CARL SMT GMBH

Method and apparatus for correcting errors on a wafer processed by a photolithographic mask

Method and apparatus for performing an aerial image simulation of a photolithographic mask

Optical system and method for correcting mask defects using the system

Method for correcting the critical dimension uniformity of a photomask for semiconductor lithography

CREE RESEARCH INC

Vertical geometry light emitting diode with group III nitride active layer and extended lifetime

Blue light-emitting diode with degenerate junction structure

Buffer structure between silicon carbide and gallium nitride and resulting semiconductor devices

TECHNOLOGIES AND DEVICES INTER

Method of crystal growth and resulted structures

Method of manufacturing GaN ingots

OSHEMKOV SERGEY

Controllable transmission and phase compensation of transparent material

Apparatus and method for inducing controllable jets in liquids

LASERGLASS LTD

Method and apparatus for generating color images in a transparent medium

PIXER TECHNOLOGY LTD

Method for correcting critical dimension variations in photomasks

BEYER DIRK

Method and apparatus for correcting errors on a wafer processed by a photolithographic mask

BEN-ZVI GUY

Method and apparatus for mapping of line-width size distributions on photomasks

U C LASER LTD

Method and apparatus for the manufacturing of reticles

PFORR RAINER

Lithographic targets for uniformity control

FORD GLOBAL TECH LLC

Apparatus for electromagnetic forming with durability and efficiency enhancements

SEMICONDUCTOR COMPONENTS IND LLC

Remote wireless sniffer management

SHARONI OFIR

Critical dimension uniformity correction by scanner signature control