Inventor
TRUPKE THORSTEN
AU18 patents
⚠️ This page may combine multiple inventors who share the name “TRUPKE THORSTEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
BT IMAGING PTY LTD
9 patentsUS9885662B2Feb 6, 2018
Methods for inspecting semiconductor wafers
BT IMAGING PTY LTD7 citations83
US10502687B2Dec 10, 2019
Methods for inspecting semiconductor wafers
BT IMAGING PTY LTD3 citations72
US10241051B2Mar 26, 2019
Methods for inspecting semiconductor wafers
BT IMAGING PTY LTD2 citations72
US9482625B2Nov 1, 2016
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
BT IMAGING PTY LTD4 citations71
US9546955B2Jan 17, 2017
Wafer imaging and processing method and apparatus
BT IMAGING PTY LTD3 citations68
US9912291B2Mar 6, 2018
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
BT IMAGING PTY LTD1 citations60
US7919762B2Apr 5, 2011
Determining diffusion length of minority carriers using luminescence
BT IMAGING PTY LTD4 citations55
US9157863B2Oct 13, 2015
Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials
BT IMAGING PTY LTD0 citations51
US9909991B2Mar 6, 2018
Method and system for inspecting indirect bandgap semiconductor structure
BT IMAGING PTY LTD0 citations50
TRUPKE THORSTEN
6 patentsUS8742372B2Jun 3, 2014
Separation of doping density and minority carrier lifetime in photoluminescence measurements on semiconductor materials
TRUPKE THORSTEN5 citations82
US8710860B2Apr 29, 2014
Method and system for testing indirect bandgap semiconductor devices using luminescence imaging
TRUPKE THORSTEN8 citations82
US8064054B2Nov 22, 2011
Method and system for inspecting indirect bandgap semiconductor structure
TRUPKE THORSTEN11 citations82
US9234849B2Jan 12, 2016
Method and system for inspecting indirect bandgap semiconductor structure
TRUPKE THORSTEN1 citations60
US8218140B2Jul 10, 2012
Method and system for inspecting indirect bandgap semiconductor stucture
TRUPKE THORSTEN1 citations60
US9103792B2Aug 11, 2015
Wafer imaging and processing method and apparatus
TRUPKE THORSTEN3 citations58