P

Inventor

YANG MING-SHENG

TW57 patents
⚠️ This page may combine multiple inventors who share the name “YANG MING-SHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

41 patents
US7449407B2Nov 11, 2008

Air gap for dual damascene applications

UNITED MICROELECTRONICS CORP59 citations98
US7253095B2Aug 7, 2007

Air gap formation method for reducing undesired capacitive coupling between interconnects in an integrated circuit device

UNITED MICROELECTRONICS CORP59 citations98
US7138329B2Nov 21, 2006

Air gap for tungsten/aluminum plug applications

UNITED MICROELECTRONICS CORP74 citations98
US6383913B1May 7, 2002

Method for improving surface wettability of low k material

UNITED MICROELECTRONICS CORP62 citations96
US6365527B1Apr 2, 2002

Method for depositing silicon carbide in semiconductor devices

UNITED MICROELECTRONICS CORP77 citations96
US6323123B1Nov 27, 2001

Low-K dual damascene integration process

UNITED MICROELECTRONICS CORP71 citations96
US6429115B1Aug 6, 2002

Method of manufacturing multilevel interconnects including performing a surface treatment to form a hydrophilic surface layer

UNITED MICROELECTRONICS CORP39 citations93
US6410446B1Jun 25, 2002

Method for gap filling

UNITED MICROELECTRONICS CORP29 citations93
US6344408B1Feb 5, 2002

Method for improving non-uniformity of chemical mechanical polishing by over coating

UNITED MICROELECTRONICS CORP44 citations93
US6214745B1Apr 10, 2001

Method of improving surface planarity of chemical-mechanical polishing operation by forming shallow dummy pattern

UNITED MICROELECTRONICS CORP21 citations93
US6197681B1Mar 6, 2001

Forming copper interconnects in dielectric materials with low constant dielectrics

UNITED MICROELECTRONICS CORP38 citations93
US6001733ADec 14, 1999

Method of forming a dual damascene with dummy metal lines

UNITED MICROELECTRONICS CORP54 citations93
US6440861B1Aug 27, 2002

Method of forming dual damascene structure

UNITED MICROELECTRONICS CORP21 citations92
US6169028B1Jan 2, 2001

Method fabricating metal interconnected structure

UNITED MICROELECTRONICS CORP34 citations92
US6077147AJun 20, 2000

Chemical-mechanical polishing station with end-point monitoring device

UNITED MICROELECTRONICS CORP42 citations92
US6905938B2Jun 14, 2005

Method of forming interconnect structure with low dielectric constant

UNITED MICROELECTRONICS CORP17 citations84
US6790742B2Sep 14, 2004

Chemical mechanical polishing in forming semiconductor device

UNITED MICROELECTRONICS CORP14 citations84
US6429152B1Aug 6, 2002

Method of forming a thin film on a semiconductor wafer

UNITED MICROELECTRONICS CORP18 citations84
US6365228B1Apr 2, 2002

Process for spin-on coating with an organic material having a low dielectric constant

UNITED MICROELECTRONICS CORP14 citations84
US6036356AMar 14, 2000

In-situ slurry mixing apparatus

UNITED MICROELECTRONICS CORP17 citations83
US6858487B2Feb 22, 2005

Method of manufacturing a semiconductor device

UNITED MICROELECTRONICS CORP10 citations74
US6723609B2Apr 20, 2004

Method of preventing leakage current of a metal-oxide semiconductor transistor

UNITED MICROELECTRONICS CORP10 citations74
US6677231B1Jan 13, 2004

Method for increasing adhesion ability of dielectric material in semiconductor

UNITED MICROELECTRONICS CORP10 citations74
US6461230B1Oct 8, 2002

Chemical-mechanical polishing method

UNITED MICROELECTRONICS CORP9 citations74
US6387813B1May 14, 2002

Method for stripping a low dielectric film with high carbon content

UNITED MICROELECTRONICS CORP7 citations74
US6376394B1Apr 23, 2002

Method of forming inter-metal dielectric layer

UNITED MICROELECTRONICS CORP9 citations74
US6200653B1Mar 13, 2001

Method of forming an intermetal dielectric layer

UNITED MICROELECTRONICS CORP9 citations74
US6062964AMay 16, 2000

Chemical mechanical polishing apparatus for controlling slurry distribution

UNITED MICROELECTRONICS CORP8 citations74
US6024106AFeb 15, 2000

Post-CMP wafer clean process

UNITED MICROELECTRONICS CORP14 citations74
US6455432B1Sep 24, 2002

Method for removing carbon-rich particles adhered on a copper surface

UNITED MICROELECTRONICS CORP8 citations73
US6406978B1Jun 18, 2002

Method of removing silicon carbide

UNITED MICROELECTRONICS CORP11 citations73
US6380069B1Apr 30, 2002

Method of removing micro-scratch on metal layer

UNITED MICROELECTRONICS CORP10 citations73
US6403469B1Jun 11, 2002

Method of manufacturing dual damascene structure

UNITED MICROELECTRONICS CORP4 citations63
US6362101B2Mar 26, 2002

Chemical mechanical polishing methods using low pH slurry mixtures

UNITED MICROELECTRONICS CORP4 citations63
US6155912ADec 5, 2000

Cleaning solution for cleaning a polishing pad used in a chemical-mechanical polishing process

UNITED MICROELECTRONICS CORP6 citations63
US6616510B2Sep 9, 2003

Chemical mechanical polishing method for copper

UNITED MICROELECTRONICS CORP3 citations62
US6609954B1Aug 26, 2003

Method of planarization

UNITED MICROELECTRONICS CORP2 citations62
US6280079B1Aug 28, 2001

Method of mixing slurries

UNITED MICROELECTRONICS CORP5 citations62
US6306757B1Oct 23, 2001

Method for forming a multilevel interconnect

UNITED MICROELECTRONICS CORP4 citations58
US7037802B2May 2, 2006

Chemical mechanical polishing in forming semiconductor device

UNITED MICROELECTRONICS CORP0 citations52
US6596652B2Jul 22, 2003

Method of fabricating low dielectric constant film

UNITED MICROELECTRONICS CORP1 citations52

HUANG CHAO-YUAN

2 patents

UNIV NAT CHI NAN

2 patents

UNITED MICORELECTRONICS CORP

1 patent

CHI MEI CORP

1 patent

PERSONAL GENOMICS INC

1 patent

UNITED MICROELECTRONICS CROP

1 patent

IPENVAL CONSULTANT INC

1 patent

Showing the top 50 of 57 patents by PatentIndex Score.