Inventor
YANG MING-SHENG
TW57 patents
⚠️ This page may combine multiple inventors who share the name “YANG MING-SHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
41 patentsUS7449407B2Nov 11, 2008
Air gap for dual damascene applications
UNITED MICROELECTRONICS CORP59 citations98
US7253095B2Aug 7, 2007
Air gap formation method for reducing undesired capacitive coupling between interconnects in an integrated circuit device
UNITED MICROELECTRONICS CORP59 citations98
US7138329B2Nov 21, 2006
Air gap for tungsten/aluminum plug applications
UNITED MICROELECTRONICS CORP74 citations98
US6383913B1May 7, 2002
Method for improving surface wettability of low k material
UNITED MICROELECTRONICS CORP62 citations96
US6365527B1Apr 2, 2002
Method for depositing silicon carbide in semiconductor devices
UNITED MICROELECTRONICS CORP77 citations96
US6323123B1Nov 27, 2001
Low-K dual damascene integration process
UNITED MICROELECTRONICS CORP71 citations96
US6429115B1Aug 6, 2002
Method of manufacturing multilevel interconnects including performing a surface treatment to form a hydrophilic surface layer
UNITED MICROELECTRONICS CORP39 citations93
US6410446B1Jun 25, 2002
Method for gap filling
UNITED MICROELECTRONICS CORP29 citations93
US6344408B1Feb 5, 2002
Method for improving non-uniformity of chemical mechanical polishing by over coating
UNITED MICROELECTRONICS CORP44 citations93
US6214745B1Apr 10, 2001
Method of improving surface planarity of chemical-mechanical polishing operation by forming shallow dummy pattern
UNITED MICROELECTRONICS CORP21 citations93
US6197681B1Mar 6, 2001
Forming copper interconnects in dielectric materials with low constant dielectrics
UNITED MICROELECTRONICS CORP38 citations93
US6001733ADec 14, 1999
Method of forming a dual damascene with dummy metal lines
UNITED MICROELECTRONICS CORP54 citations93
US6440861B1Aug 27, 2002
Method of forming dual damascene structure
UNITED MICROELECTRONICS CORP21 citations92
US6169028B1Jan 2, 2001
Method fabricating metal interconnected structure
UNITED MICROELECTRONICS CORP34 citations92
US6077147AJun 20, 2000
Chemical-mechanical polishing station with end-point monitoring device
UNITED MICROELECTRONICS CORP42 citations92
US6905938B2Jun 14, 2005
Method of forming interconnect structure with low dielectric constant
UNITED MICROELECTRONICS CORP17 citations84
US6790742B2Sep 14, 2004
Chemical mechanical polishing in forming semiconductor device
UNITED MICROELECTRONICS CORP14 citations84
US6429152B1Aug 6, 2002
Method of forming a thin film on a semiconductor wafer
UNITED MICROELECTRONICS CORP18 citations84
US6365228B1Apr 2, 2002
Process for spin-on coating with an organic material having a low dielectric constant
UNITED MICROELECTRONICS CORP14 citations84
US6036356AMar 14, 2000
In-situ slurry mixing apparatus
UNITED MICROELECTRONICS CORP17 citations83
US6858487B2Feb 22, 2005
Method of manufacturing a semiconductor device
UNITED MICROELECTRONICS CORP10 citations74
US6723609B2Apr 20, 2004
Method of preventing leakage current of a metal-oxide semiconductor transistor
UNITED MICROELECTRONICS CORP10 citations74
US6677231B1Jan 13, 2004
Method for increasing adhesion ability of dielectric material in semiconductor
UNITED MICROELECTRONICS CORP10 citations74
US6461230B1Oct 8, 2002
Chemical-mechanical polishing method
UNITED MICROELECTRONICS CORP9 citations74
US6387813B1May 14, 2002
Method for stripping a low dielectric film with high carbon content
UNITED MICROELECTRONICS CORP7 citations74
US6376394B1Apr 23, 2002
Method of forming inter-metal dielectric layer
UNITED MICROELECTRONICS CORP9 citations74
US6200653B1Mar 13, 2001
Method of forming an intermetal dielectric layer
UNITED MICROELECTRONICS CORP9 citations74
US6062964AMay 16, 2000
Chemical mechanical polishing apparatus for controlling slurry distribution
UNITED MICROELECTRONICS CORP8 citations74
US6024106AFeb 15, 2000
Post-CMP wafer clean process
UNITED MICROELECTRONICS CORP14 citations74
US6455432B1Sep 24, 2002
Method for removing carbon-rich particles adhered on a copper surface
UNITED MICROELECTRONICS CORP8 citations73
US6406978B1Jun 18, 2002
Method of removing silicon carbide
UNITED MICROELECTRONICS CORP11 citations73
US6380069B1Apr 30, 2002
Method of removing micro-scratch on metal layer
UNITED MICROELECTRONICS CORP10 citations73
US6403469B1Jun 11, 2002
Method of manufacturing dual damascene structure
UNITED MICROELECTRONICS CORP4 citations63
US6362101B2Mar 26, 2002
Chemical mechanical polishing methods using low pH slurry mixtures
UNITED MICROELECTRONICS CORP4 citations63
US6155912ADec 5, 2000
Cleaning solution for cleaning a polishing pad used in a chemical-mechanical polishing process
UNITED MICROELECTRONICS CORP6 citations63
US6616510B2Sep 9, 2003
Chemical mechanical polishing method for copper
UNITED MICROELECTRONICS CORP3 citations62
US6609954B1Aug 26, 2003
Method of planarization
UNITED MICROELECTRONICS CORP2 citations62
US6280079B1Aug 28, 2001
Method of mixing slurries
UNITED MICROELECTRONICS CORP5 citations62
US6306757B1Oct 23, 2001
Method for forming a multilevel interconnect
UNITED MICROELECTRONICS CORP4 citations58
US7037802B2May 2, 2006
Chemical mechanical polishing in forming semiconductor device
UNITED MICROELECTRONICS CORP0 citations52
US6596652B2Jul 22, 2003
Method of fabricating low dielectric constant film
UNITED MICROELECTRONICS CORP1 citations52
HUANG CHAO-YUAN
2 patentsUNIV NAT CHI NAN
2 patentsUNITED MICORELECTRONICS CORP
1 patentCHI MEI CORP
1 patentPERSONAL GENOMICS INC
1 patentUNITED MICROELECTRONICS CROP
1 patentIPENVAL CONSULTANT INC
1 patentShowing the top 50 of 57 patents by PatentIndex Score.