P

Inventor

ISHIKAWA TETSUYA

JP263 patents
⚠️ This page may combine multiple inventors who share the name “ISHIKAWA TETSUYA”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

APPLIED MATERIALS INC

47 patents
US6596655B1Jul 22, 2003

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC77 citations99
US6562690B1May 13, 2003

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC102 citations99
US6541282B1Apr 1, 2003

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC80 citations99
US6348725B2Feb 19, 2002

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC161 citations99
US6303523B2Oct 16, 2001

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC751 citations99
US6070551AJun 6, 2000

Deposition chamber and method for depositing low dielectric constant films

APPLIED MATERIALS INC135 citations99
US5944902AAug 31, 1999

Plasma source for HDP-CVD chamber

APPLIED MATERIALS INC335 citations99
US5888414AMar 30, 1999

Plasma reactor and processes using RF inductive coupling and scavenger temperature control

APPLIED MATERIALS INC203 citations99
US5824607AOct 20, 1998

Plasma confinement for an inductively coupled plasma reactor

APPLIED MATERIALS INC144 citations99
US5772771AJun 30, 1998

Deposition chamber for improved deposition thickness uniformity

APPLIED MATERIALS INC176 citations99
US7955986B2Jun 7, 2011

Capacitively coupled plasma reactor with magnetic plasma control

APPLIED MATERIALS INC70 citations98
US7036453B2May 2, 2006

Apparatus for reducing plasma charge damage for plasma processes

APPLIED MATERIALS INC467 citations98
US6929700B2Aug 16, 2005

Hydrogen assisted undoped silicon oxide deposition process for HDP-CVD

APPLIED MATERIALS INC482 citations98
US6660662B2Dec 9, 2003

Method of reducing plasma charge damage for plasma processes

APPLIED MATERIALS INC478 citations98
US6660656B2Dec 9, 2003

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC111 citations98
US6596653B2Jul 22, 2003

Hydrogen assisted undoped silicon oxide deposition process for HDP-CVD

APPLIED MATERIALS INC542 citations98
US6518195B1Feb 11, 2003

Plasma reactor using inductive RF coupling, and processes

APPLIED MATERIALS INC162 citations98
US6447651B1Sep 10, 2002

High-permeability magnetic shield for improved process uniformity in nonmagnetized plasma process chambers

APPLIED MATERIALS INC501 citations98
US6189483B1Feb 20, 2001

Process kit

APPLIED MATERIALS INC341 citations98
US6170428B1Jan 9, 2001

Symmetric tunable inductively coupled HDP-CVD reactor

APPLIED MATERIALS INC430 citations98
US6143078ANov 7, 2000

Gas distribution system for a CVD processing chamber

APPLIED MATERIALS INC147 citations98
US6068784AMay 30, 2000

Process used in an RF coupled plasma reactor

APPLIED MATERIALS INC173 citations98
US5761023AJun 2, 1998

Substrate support with pressure zones having reduced contact area and temperature feedback

APPLIED MATERIALS INC218 citations98
US5556501ASep 17, 1996

Silicon scavenger in an inductively coupled RF plasma reactor

APPLIED MATERIALS INC396 citations98
US5350479ASep 27, 1994

Electrostatic chuck for high power plasma processing

APPLIED MATERIALS INC199 citations98
US7925377B2Apr 12, 2011

Cluster tool architecture for processing a substrate

APPLIED MATERIALS INC45 citations97
US6734115B2May 11, 2004

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC67 citations97
US6545420B1Apr 8, 2003

Plasma reactor using inductive RF coupling, and processes

APPLIED MATERIALS INC135 citations97
US6488807B1Dec 3, 2002

Magnetic confinement in a plasma reactor having an RF bias electrode

APPLIED MATERIALS INC145 citations97
US6486081B1Nov 26, 2002

Gas distribution system for a CVD processing chamber

APPLIED MATERIALS INC124 citations97
US6251792B1Jun 26, 2001

Plasma etch processes

APPLIED MATERIALS INC122 citations97
US6239553B1May 29, 2001

RF plasma source for material processing

APPLIED MATERIALS INC119 citations97
US6182602B1Feb 6, 2001

Inductively coupled HDP-CVD reactor

APPLIED MATERIALS INC386 citations97
US6083344AJul 4, 2000

Multi-zone RF inductively coupled source configuration

APPLIED MATERIALS INC346 citations97
US7743728B2Jun 29, 2010

Cluster tool architecture for processing a substrate

APPLIED MATERIALS INC36 citations96
US7694647B2Apr 13, 2010

Cluster tool architecture for processing a substrate

APPLIED MATERIALS INC42 citations96
US6869896B2Mar 22, 2005

Plasma processes for depositing low dielectric constant films

APPLIED MATERIALS INC37 citations96
US6833052B2Dec 21, 2004

Deposition chamber and method for depositing low dielectric constant films

APPLIED MATERIALS INC65 citations96
US6589610B2Jul 8, 2003

Deposition chamber and method for depositing low dielectric constant films

APPLIED MATERIALS INC53 citations96
US6416823B2Jul 9, 2002

Deposition chamber and method for depositing low dielectric constant films

APPLIED MATERIALS INC61 citations96
US6383954B1May 7, 2002

Process gas distribution for forming stable fluorine-doped silicate glass and other films

APPLIED MATERIALS INC90 citations96
US6286451B1Sep 11, 2001

Dome: shape and temperature controlled surfaces

APPLIED MATERIALS INC101 citations96
US5876119AMar 2, 1999

In-situ substrate temperature measurement scheme in plasma reactor

APPLIED MATERIALS INC58 citations96
US5800621ASep 1, 1998

Plasma source for HDP-CVD chamber

APPLIED MATERIALS INC52 citations96
US5583737ADec 10, 1996

Electrostatic chuck usable in high density plasma

APPLIED MATERIALS INC57 citations96
US7221553B2May 22, 2007

Substrate support having heat transfer system

APPLIED MATERIALS INC49 citations95
US5539609AJul 23, 1996

Electrostatic chuck usable in high density plasma

APPLIED MATERIALS INC60 citations95

SOKUDO CO LTD

1 patent

(unassigned)

1 patent

CANON KK

1 patent

Showing the top 50 of 263 patents by PatentIndex Score.