P

Inventor

SUN CHIA-CHEN

TW21 patents
⚠️ This page may combine multiple inventors who share the name “SUN CHIA-CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

UNITED MICROELECTRONICS CORP

18 patents
US10156526B1Dec 18, 2018

Method for reviewing defects

UNITED MICROELECTRONICS CORP2 citations71
US10082471B2Sep 25, 2018

Semiconductor structure and method for reviewing defects

UNITED MICROELECTRONICS CORP2 citations71
US10566290B2Feb 18, 2020

Alignment mark and measurement method thereof

UNITED MICROELECTRONICS CORP4 citations69
US12416855B2Sep 16, 2025

Photomask structure

UNITED MICROELECTRONICS CORP0 citations62
US10983428B2Apr 20, 2021

Mask and method of forming pattern

UNITED MICROELECTRONICS CORP0 citations62
US12439579B2Oct 7, 2025

Static random access memory and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations61
US12261083B2Mar 25, 2025

Semiconductor device and method for fabricating the same

UNITED MICROELECTRONICS CORP0 citations61
US12474635B2Nov 18, 2025

Photomask structure

UNITED MICROELECTRONICS CORP0 citations52
US12429762B2Sep 30, 2025

Method of forming a layout pattern and photomask

UNITED MICROELECTRONICS CORP0 citations52
US12394730B2Aug 19, 2025

Semiconductor structure

UNITED MICROELECTRONICS CORP0 citations51
US12322711B2Jun 3, 2025

Die seal ring structure

UNITED MICROELECTRONICS CORP0 citations51
US10510677B2Dec 17, 2019

Die

UNITED MICROELECTRONICS CORP0 citations51
US8850370B2Sep 30, 2014

Method of manufacturing semiconductor circuit structure

UNITED MICROELECTRONICS CORP0 citations51
US7932104B2Apr 26, 2011

Method for inspecting photoresist pattern

UNITED MICROELECTRONICS CORP0 citations51
US12588296B2Mar 24, 2026

ESD guard ring structure and fabricating method of the same

UNITED MICROELECTRONICS CORP0 citations50
US12321287B1Jun 3, 2025

Interconnects for physically unclonable function and method of achieving physically unclonable function through interconnects

UNITED MICROELECTRONICS CORP0 citations49
US11372324B2Jun 28, 2022

Method for correcting mask pattern and mask pattern thereof

UNITED MICROELECTRONICS CORP0 citations48
US10176289B2Jan 8, 2019

Method for decomposing semiconductor layout pattern

UNITED MICROELECTRONICS CORP0 citations41

KANG CHIH-KAI

2 patents

SUN CHIA-CHEN

1 patent