Inventor
SUN CHIA-CHEN
TW21 patents
⚠️ This page may combine multiple inventors who share the name “SUN CHIA-CHEN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
UNITED MICROELECTRONICS CORP
18 patentsUS10156526B1Dec 18, 2018
Method for reviewing defects
UNITED MICROELECTRONICS CORP2 citations71
US10082471B2Sep 25, 2018
Semiconductor structure and method for reviewing defects
UNITED MICROELECTRONICS CORP2 citations71
US10566290B2Feb 18, 2020
Alignment mark and measurement method thereof
UNITED MICROELECTRONICS CORP4 citations69
US12416855B2Sep 16, 2025
Photomask structure
UNITED MICROELECTRONICS CORP0 citations62
US10983428B2Apr 20, 2021
Mask and method of forming pattern
UNITED MICROELECTRONICS CORP0 citations62
US12439579B2Oct 7, 2025
Static random access memory and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations61
US12261083B2Mar 25, 2025
Semiconductor device and method for fabricating the same
UNITED MICROELECTRONICS CORP0 citations61
US12474635B2Nov 18, 2025
Photomask structure
UNITED MICROELECTRONICS CORP0 citations52
US12429762B2Sep 30, 2025
Method of forming a layout pattern and photomask
UNITED MICROELECTRONICS CORP0 citations52
US12394730B2Aug 19, 2025
Semiconductor structure
UNITED MICROELECTRONICS CORP0 citations51
US12322711B2Jun 3, 2025
Die seal ring structure
UNITED MICROELECTRONICS CORP0 citations51
US10510677B2Dec 17, 2019
Die
UNITED MICROELECTRONICS CORP0 citations51
US8850370B2Sep 30, 2014
Method of manufacturing semiconductor circuit structure
UNITED MICROELECTRONICS CORP0 citations51
US7932104B2Apr 26, 2011
Method for inspecting photoresist pattern
UNITED MICROELECTRONICS CORP0 citations51
US12588296B2Mar 24, 2026
ESD guard ring structure and fabricating method of the same
UNITED MICROELECTRONICS CORP0 citations50
US12321287B1Jun 3, 2025
Interconnects for physically unclonable function and method of achieving physically unclonable function through interconnects
UNITED MICROELECTRONICS CORP0 citations49
US11372324B2Jun 28, 2022
Method for correcting mask pattern and mask pattern thereof
UNITED MICROELECTRONICS CORP0 citations48
US10176289B2Jan 8, 2019
Method for decomposing semiconductor layout pattern
UNITED MICROELECTRONICS CORP0 citations41