Inventor

XAVIER ARUNNELSON

US2 patents

Patents

2 patents

US11269115B2Mar 8, 2022

Speckled calibration artifact to calibrate metrology equipment

PHOTOGAUGE INC1 citations52

US11810282B2Nov 7, 2023

System and method for quantitative image quality assessment for photogrammetry

PHOTOGAUGE INC0 citations45