Inventor
LEE PEI-HSUAN
TW42 patents
⚠️ This page may combine multiple inventors who share the name “LEE PEI-HSUAN”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.
TAIWAN SEMICONDUCTOR MFG CO LTD
40 patentsUS10790142B2Sep 29, 2020
Selective capping processes and structures formed thereby
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations83
US10770288B2Sep 8, 2020
Selective capping processes and structures formed thereby
TAIWAN SEMICONDUCTOR MFG CO LTD9 citations83
US10366966B1Jul 30, 2019
Method of manufacturing integrated fan-out package
TAIWAN SEMICONDUCTOR MFG CO LTD8 citations83
US11502013B2Nov 15, 2022
Integrated circuit package and method
TAIWAN SEMICONDUCTOR MFG CO LTD4 citations73
US11444002B2Sep 13, 2022
Package structure
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US11004758B2May 11, 2021
Integrated circuit package and method
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9887073B2Feb 6, 2018
Physical vapor deposition system and physical vapor depositing method using the same
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations73
US9425179B2Aug 23, 2016
Chip packages and methods of manufacture thereof
TAIWAN SEMICONDUCTOR MFG CO LTD5 citations73
US11756872B2Sep 12, 2023
Package structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations72
US11380542B2Jul 5, 2022
Selective capping processes and structures formed thereby
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations72
US10756052B2Aug 25, 2020
Method of manufacturing integrated fan-out package
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations72
US11742290B2Aug 29, 2023
Interconnect structure and method of forming thereof
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations71
US10727118B2Jul 28, 2020
Method for manufacturing semiconductor device and pre-clean apparatus for semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD2 citations70
US10510623B2Dec 17, 2019
Overlay error and process window metrology
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations70
US11121046B2Sep 14, 2021
Wafer-level testing method and test structure thereof
TAIWAN SEMICONDUCTOR MFG CO LTD3 citations68
US12374595B2Jul 29, 2025
Package system and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12300571B2May 13, 2025
Integrated circuit package and method
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12061229B2Aug 13, 2024
In-line electrical detection of defects at wafer level
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12040247B2Jul 16, 2024
Package system and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11990381B2May 21, 2024
Integrated circuit packages having support rings
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11830742B2Nov 28, 2023
Selective capping processes and structures formed thereby
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11749582B2Sep 5, 2023
Package structure
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11538735B2Dec 27, 2022
Method of forming integrated circuit packages with mechanical braces
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11282810B2Mar 22, 2022
Integrated fan-out package and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US11152258B2Oct 19, 2021
Method of forming an interconnect in a semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations62
US12176279B2Dec 24, 2024
Package structure and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12159830B2Dec 3, 2024
Nitrogen plasma treatment for improving interface between etch stop layer and copper interconnect
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12062832B2Aug 13, 2024
Electronic device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US11075439B2Jul 27, 2021
Electronic device and manufacturing method thereof
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations61
US12165975B2Dec 10, 2024
Method of forming interconnect structure having a barrier layer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations60
US11791206B2Oct 17, 2023
Method for forming semiconductor device
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations59
US12243218B2Mar 4, 2025
Method and system for scanning wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11783469B2Oct 10, 2023
Method and system for scanning wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US11037289B2Jun 15, 2021
Method and system for scanning wafer
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations58
US12543553B2Feb 3, 2026
Forming liners to facilitate the formation of copper-containing vias in advanced technology nodes
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9805951B1Oct 31, 2017
Method of integration process for metal CMP
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations52
US9460939B2Oct 4, 2016
Package-on-package structures and methods of manufacture thereof
TAIWAN SEMICONDUCTOR MFG CO LTD1 citations52
US11984365B2May 14, 2024
Semiconductor structure inspection using a high atomic number material
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US11532548B2Dec 20, 2022
Nitrogen plasma treatment for improving interface between etch stop layer and copper interconnect
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations51
US10879135B2Dec 29, 2020
Overlay error and process window metrology
TAIWAN SEMICONDUCTOR MFG CO LTD0 citations49