P

Inventor

BAGGEN MARCEL KOENRAAD MARIE

NL17 patents
⚠️ This page may combine multiple inventors who share the name “BAGGEN MARCEL KOENRAAD MARIE”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

ASML NETHERLANDS BV

16 patents
US7459701B2Dec 2, 2008

Stage apparatus, lithographic apparatus and device manufacturing method

ASML NETHERLANDS BV12 citations79
US10191393B2Jan 29, 2019

Lithographic apparatus, and device manufacturing method

ASML NETHERLANDS BV3 citations71
US7239370B2Jul 3, 2007

Lithographic apparatus and device manufacturing method

ASML NETHERLANDS BV8 citations71
US6707530B2Mar 16, 2004

Lithographic apparatus, device manufacturing method, and device manufactured thereby

ASML NETHERLANDS BV11 citations71
US11315752B2Apr 26, 2022

E-beam apparatus

ASML NETHERLANDS BV2 citations70
US10867770B2Dec 15, 2020

E-beam apparatus

ASML NETHERLANDS BV2 citations70
US8368868B2Feb 5, 2013

Lithographic apparatus with gas pressure means for controlling a planar position of a patterning device contactless

ASML NETHERLANDS BV2 citations62
US7675607B2Mar 9, 2010

Lithographic apparatus and device manufacturing method

ASML NETHERLANDS BV3 citations61
US7667822B2Feb 23, 2010

Lithographic apparatus and stage apparatus

ASML NETHERLANDS BV6 citations60
US7884919B2Feb 8, 2011

Lithographic apparatus and device manufacturing method

ASML NETHERLANDS BV4 citations59
US7830495B2Nov 9, 2010

Lithographic apparatus and position sensor

ASML NETHERLANDS BV4 citations58
US11476077B2Oct 18, 2022

Interferometric stage positioning apparatus

ASML NETHERLANDS BV0 citations51
US7733463B2Jun 8, 2010

Lithographic apparatus and device manufacturing method

ASML NETHERLANDS BV0 citations49
US11621142B2Apr 4, 2023

Substrate positioning device and electron beam inspection tool

ASML NETHERLANDS BV0 citations48
US11302512B2Apr 12, 2022

Electron beam inspection apparatus stage positioning

ASML NETHERLANDS BV0 citations47
US10809634B2Oct 20, 2020

Stage system and metrology tool

ASML NETHERLANDS BV0 citations35

VAN DER TOORN JAN-GERARD CORNELIS

1 patent