Inventor

LIU BICHENG

CN20 patents

⚠️ This page may combine multiple inventors who share the name “LIU BICHENG”. Patents are grouped by organization below to help distinguish them — per-person disambiguation is on the roadmap.

LIU BICHENG

NUCTECH CO LTD

Inspection devices and methods for inspecting a container

Multi-energy-spectrum X-ray imaging system and method of substance identification of item to be inspected by using the same

Multi-energy spectrum x-ray imaging systems and methods for recognizing article using multi-energy spectrum x-ray imaging system

Semiconductor detector

Semiconductor detector

Image data processing method, device and security inspection system based on VR or AR

Security inspection based on scanned images

Backscatter imaging device, control method and inspection system

Spiral CT device and Three-dimensional image reconstruction method

Image processing method, device, and computer readable storage medium

Method and device for correcting a scanned image and image scanning system

Semiconductor detector and method for packaging the same

Apparatuses for processing signals for a plurality of energy regions, and systems and methods for detecting radiation of a plurality of energy regions

Semiconductor detector

Dual-energy ray scanning system, scanning method and inspecting system

UNIV TSINGHUA

Method, apparatus and system for inspecting object based on cosmic ray

Back scattering inspection system and back scattering inspection method

Substance identification device and method for extracting statistical feature based on cluster analysis

Method, device and system for inspecting moving object based on cosmic rays

Decomposition method and apparatus based on basis material combination